Philips Semiconductors FAST Products

Product specification

74F8960/74F8961

Octal latched bidirectional Futurebus transceivers

(3-State + open-collector)

December 19, 1990

8

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

MIN.

TYP.

2

MAX.

High–level output current

B0 – B7

100

µA

Power–off output current

B0 – B7

100

µA

2.5

V

High-level output voltage

2.5

V

0.50

V

Low-level output voltage

B0 – B78

1.15

V

0.40

V

Input clamp voltage

A0 – A7

-0.5

V

Except A0 – A7

-1.2

V

Input current at

OEBn, OEA, LE

100

maximum input voltage

A0–A7, B0 – B7

1

mA

High–level input current

OEBn, OEA, LE

20

B0–B7

100

Low–level input current

OEBn, OEA, LE

–20

B0 – B7

–100

Off–state output current,

high–level current applied

A0 – A7

70

Off–state output current,

low–level voltage applied

A0 – A7

–70

High–level control current

2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V,

–100

100

OEBn = A0 – A7 = 2.7V, B0 – B7 = 2.0V,

–10

10

Short circuit output

A0–A7

only

’F8960

74F8960

2.7V

-60

-150

mA

only

74F8961

2.7V

65

100

mA

Supply current (total)

100

145

mA

75

100

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type

and function table for operating mode.

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any