Philips Semiconductors FAST Products

Product specification

74F410

Register stack – 16

×4 RAM 3-State output register

January 8, 1990

5

AC WAVEFORMS

Waveform 1. Read cycle timing

CP

VM

VM

VM

VM

VM

VM

tsu(H)

th(H)

An

VM

tw(H)

tsu(L)

th(L)

VM

VM

Qn

tw(L)

tPLH

Waveform 2. Write cycle timing

WE

VM

VM

VM

VM

VM

VM

CS

tsu(H)

th(H)

tsu(L)

th(L)

tsu(L)

th(L)

VM

tsu(H)

th(H)

VM

VM

VM

VM

VM

tsu(H)

th(H)

An,

Dn

tsu(L)

th(L)

VM

VM

VM

VM

CS

WE

CP

Waveform 3. 3-State output enable time to high level

and output disable time from high level

VM

VM

VM

tPHZ

tPZH

VOH -0.3V

0V

OE

Qn

Waveform 4. 3-State output enable time to low level

and output disable time from low level

VM

VM

VM

tPLZ

tPZL

VOL +0.3V

Qn

OE

tPHL

NOTES:

2. The shaded areas indicate when the input is permitted to change for predictable output performance.

TEST CIRCUIT AND WAVEFORM

tW

90%

VM

10%

90%

VM

10%

90%

VM

10%

90%

VM

10%

NEGATIVE

PULSE

POSITIVE

PULSE

tW

AMP (V)

0V

0V

tTHL (tf )

INPUT PULSE REQUIREMENTS

rep. rate

1MHz

500ns 2.5ns

2.5ns

Input pulse definition

VCC

family

74F

D.U.T.

PULSE

GENERATOR

RL

CL

RT

VIN

VOUT

Test circuit for 3–state outputs

DEFINITIONS:

value.

capacitance; see AC electrical characteristics for

value

pulse generators.

tTHL (tf )

tTLH (tr )

tTLH (tr )

AMP (V)

amplitude

3.0V

1.5V

RL

7.0V

SWITCH POSITION

TEST

SWITCH

closed

open

All other