74F40 datasheet(3/3 Pages) PHILIPS

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Philips Semiconductors FAST Products

Product specification

74F40

Dual 4-input NAND buffer

April 11, 1989

AC ELECTRICAL CHARACTERISTICS

SYMBOL

PARAMETER

TEST

CONDITION

LIMITS

UNIT

SYMBOL

PARAMETER

TEST

CONDITION

VCC = +5.0V

VCC = +5.0V ± 10%

UNIT

SYMBOL

PARAMETER

TEST

CONDITION

Tamb = +25°C

Tamb = 0°C to +70°C

UNIT

CONDITION

CL = 50pF, RL = 500Ω

MIN

TYP

MAX

MIN

MAX

tPLH

tPHL

Propagation delay

Dna, Dnb, Dnc, Dnd to Qn

Waveform 1

2.0

1.5

4.0

3.0

6.0

5.0

1.5

1.0

7.0

5.5

AC WAVEFORMS

Dna, Dnb, Dnc, Dnd

tPHL

tPLH

SF00069

Waveform 1.

Propagation Delay for Inverting Outputs

NOTE:

For all waveforms, VM = 1.5V.

TEST CIRCUIT AND WAVEFORMS

90%

10%

90%

10%

90%

10%

90%

10%

NEGATIVE

PULSE

POSITIVE

PULSE

AMP (V)

tTHL (tf )

INPUT PULSE REQUIREMENTS

rep. rate

tTLH

tTHL

1MHz

500ns

2.5ns

Input Pulse Definition

VCC

family

74F

D.U.T.

PULSE

GENERATOR

VIN

VOUT

Test Circuit for Totem-Pole Outputs

DEFINITIONS:

RL = Load resistor;

see AC electrical characteristics for value.

CL = Load capacitance includes jig and probe capacitance;

see AC electrical characteristics for value.

RT = Termination resistance should be equal to ZOUT of

pulse generators.

tTHL (tf )

tTLH (tr )

AMP (V)

amplitude

3.0V

1.5V

SF00006

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