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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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74F367 датащи(PDF) 6 Page - NXP Semiconductors |
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74F367 датащи(HTML) 6 Page - NXP Semiconductors |
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6 / 10 page  Philips Semiconductors Product specification 74F365, 74F366* 74F367, 74F368* Buffers/drivers 1999 Jan 08 6 * Discontinued part. Please see the Discontinued Products List. DC ELECTRICAL CHARACTERISTICS Over recommended operating free-air temperature range unless otherwise noted. NO TAG LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX VCC = MIN, VIL = MAX, "10%VCC 2.4 V VO High level output voltage VCC MIN, VIL MAX, VIH = MIN, IOH = –3mA "5%VCC 2.7 3.3 V VOH High-level output voltage VCC = MIN, VIL = MAX, "10%VCC 2.0 V VCC MIN, VIL MAX, VIH = MIN, IOH = –15mA "5%VCC 2.0 V VO Low level output voltage VCC = MIN, VIL = MAX, "10%VCC 0.55 V VOL Low-level output voltage VCC = MIN, VIL MAX, VIH = MIN, IOL = MAX "5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output currentNO TAG VCC = MAX –100 –225 mA ICCH 25 35 mA 74F365 74F367 ICCL VCC = MAX 47 62 mA ICC Supply current (total) 74F367 ICCZ 35 48 mA ICC Supply current (total) ICCH 18 25 mA 74F366 74F368 ICCL VCC = MAX 47 62 mA 74F368 ICCZ 35 48 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS TEST TA = +25°C TA = -55°C to +125°C SYMBOL PARAMETER TEST CONDITIONS VCC = +5.0V VCC = +5.0V ± 10% UNIT CONDITIONS CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX tPLH tPHL Propagation delay In to Yn 74F366, 74F368 Waveform 1 3.0 2.0 5.0 3.0 6.5 5.0 3.0 1.5 7.5 5.5 ns ns tPLH tPHL Propagation delay In to Yn 74F365, 74F367 Waveform 2 2.5 2.5 4.5 5.5 6.5 7.0 2.0 2.0 7.0 7.5 ns ns tPZH tPZL Output Enable time to High or Low level 74F365, 74F366 Waveform 3 Waveform 4 2.5 2.5 4.0 5.0 6.5 8.0 2.5 2.5 7.5 8.5 ns ns tPZH tPZL Output Enable time to High or Low level 74F367, 74F368 Waveform 3 Waveform 4 3.0 3.0 5.5 6.5 7.5 8.5 3.0 3.0 8.5 9.0 ns ns tPHZ tPLZ Output Disable time from High to Low level Waveform 3 Waveform 4 2.0 2.0 4.5 4.0 6.5 6.5 2.0 2.0 7.0 7.0 ns ns |
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