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74F322 датащи(PDF) 5 Page - NXP Semiconductors |
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74F322 датащи(HTML) 5 Page - NXP Semiconductors |
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5 / 9 page ![]() Philips Semiconductors Product specification 74F322 8-bit serial/parallel register with sign extend (3-State) 1988 Apr 22 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VOH High-level output voltage Q7 VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±10%VCC 2.5 V VOH High-level output voltage Q7 VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±5%VCC 2.7 3.4 V VOH High-level output voltage I/On VIL = MAX, VIH = MIN IOH = –3mA ±10%VCC 2.4 V I/On VIH = MIN IOH = –3mA ±5%VCC 2.7 3.3 V VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±10%VCC 0.38 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage others VCC = MAX, VI = 7.0V 100 µA Input current at maximum input voltage I/On VCC = MAX, VI = 5.5V 1 mA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current SE VCC = MAX, VI = 0.5V –1.8 mA IIL Low-level input current S VCC = MAX, VI = 0.5V –1.2 mA IL others CC = MAX, VI = 0.5V –0.6 mA IIH + IOZH Off-state output current High-level voltage applied VCC = MAX, VI = 2.7V 70 µA IIL + IOZL Off-state output current Low-level voltage applied VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICCH VCC = MAX 50 75 mA ICC Supply current (total) ICCL VCC = MAX 60 90 mA ICCZ CC = MAX 65 95 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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