Appendix 2 - 10

-55

°C < T

Notes:

1. All tests guaranteed per test figure 6.

2. Capacitance is measured only for initial qualification and after any process or design changes which may affect input or output capacitance.

3. Pass/fail criteria per the test method described in MIL-HDBK-1553 Appendix A, RT Validation Test Plan, Section 5.1.2.2, Common Mode Rejection.

4. Guaranteed by design.

5. Guaranteed to the limits specified if not tested.

SYMBOL

PARAMETER

MINIMUM

MAXIMUM

UNIT

CONDITION

2

Input capacitance

15

pF

RXEN; input

ƒ = 1MHz @ 0V

2

Output capacitance

20

pF

RXOUT, RXOUT;

ƒ = 1MHz @ 0V

5

Common mode input

voltage

-5

5

V

200ns rise/fall time

±25ns,

ƒ = 1MHz

Input threshold

Input threshold voltage

(no response)

Input threshold

Input threshold voltage

(response)

0.86

1.20

0.20

0.28

14.0

Transformer-coupled stub; input at

ƒ = 1MHz, rise/fall time 200ns at

(Receiver output 0

→ 1 transition)

Direct-coupled stub; input at

ƒ = 1MHz,

rise/fall time 200ns at (Receiver output

0

→ 1 transition)

Transformer-coupled stub; input at

ƒ = 1MHz, rise/fall time 200ns at

(Receiver output 0

→ 1 transition)

Direct-coupled stub; input at

ƒ = 1MHz,

rise/fall time 200ns at (Receiver output

0

→ 1 transition)

Common mode

rejection ratio

N/A