101SHT100AS1LE datasheet(8/34 Pages) EXXELIA

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CERAMIC CAPACITORS

124

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Page revised 06/20

II. PARAMETERS OF SUBSTRATES AND CAPACITORS WITCH INFLUENCES THE

PRF

As the PRF is linked to the parasitic parallel capacitance, when the capacitor

is mounted on a PCB, the main parameters witch could inﬂuence the PRF are:

• PCB parameters

• Capacitor parameters

- Capacitance value

- Geometry and size

- Electrode orientation (horizontal or vertical)

- Internal design

For example in the following screen plots, we can see that the ﬁrst PRF is about

1.8GHz when the capacitor is mounted horizontally and is not visible when it

is mounted vertically.

–2

–4

–6

GHz

1.8

Horizontal mounting

–2

–4

–6

GHz

1.8

Vertical mounting

Figure 9: Example of PRF measurement (501SHB390JS on a FR4 PCB

horizontal and vertical mounting)

[Ref. 1] Monolithic Capacitors as Transmission Lines. Marc INGALLS and Gordon

KENT IEE Transactions on Microwaves Theory and Techniques, Vol. MTT-35,

N°11 november1987, pp. 964-970.

CAPACITOR RELIABILITY DATA MIL-STD CDR

STYLES, RF & AMP; MICROWAVE SYSTEMS

I. TYPICAL RELIABILITY TESTS

• Adhesive Strength of Termination

• Bending Strength

• Solderability of Termination

• Resistance to Soldering Heat

• Thermal shock –55°C to +125°C

• Humidity Load (240 hours, 85% relative humidity at +85°C)

• High Temperature Load (1000/2000h, 125°C, x UN)

II. RELIABILITY DATA MONITORING

II.1. General Manufacturing Process

At each step of the manufacturing process, speciﬁc checks have been set-up

to guarantee the quality level of our products. Statistical Process Controls (also

known as SPC) are utilized to monitor key parameters within processes.

In addition to all these in-process controls, a sample of capacitors from each

lot is micro-sectioned to check the internal structure and the absence of voids,

delaminations, cracks or other defects.

When manufacturing is completed, the multilayer ceramic capacitors are fully

screened for Capacitance, Dissipation Factor, Dielectric Withstanding Voltage,

Insulation Resistance and Visual Defects.

II.2. Reliability Testing

During qualiﬁcation of new capacitor series or at random intervals, EXXELIA

performs life tests – 2,000 hours, +125°C, 2 x WVDC - and uses MIL-PRF-55681

as a guideline. The following parameters best describe our multilayer ceramic

capacitors for military applications:

• data from MIL-PRF- 55681 revision F;

• capacitor, chip, multiple layer, ﬁxed, ceramic dielectric, established

reliability;

• rated temperature: –55°C to +125°C;

• CDR11, CDR12, CDR13 and CDR14 case sizes;

• Failure Rate levels C, M, P, R and S.

The data obtained from our continuous life test monitoring are used to

calculate an equivalent part failure rate and to compare it to the Failure Rate

level as deﬁned in MIL-PRF-55681F. The methods and formulae used are based

on MIL-HDBK271F and MIL-STD-690D.

An acceleration factor of 8:1 is used to relate life test data obtained at 200%

rated voltage at maximum rated temperature, to rated voltage at maximum

rated temperature (125°C). The following formula is used:

AF =

( )x2

T–T0

where V0 is the rated voltage, T0 the rated temperature, V and T the life test

parameters.

III. RELIABILITY DATA SUMMARY

As stated in MIL-STD- 690D, data are accumulated from sample units selected

from a production run and produced with equipment and procedures normally

used in production. One of the prerequisites for valid data is that all lots

produced during the production period be represented. The data are from

the same product in current production, i.e. data from products of preceding

designs are not acceptable.

General Information

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