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DF2B7AFS датащи(PDF) 4 Page - Toshiba Semiconductor |
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DF2B7AFS датащи(HTML) 4 Page - Toshiba Semiconductor |
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4 / 8 page ![]() DF2B7AFS 4 6. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 �) Characteristics Electrostatic discharge voltage (IEC61000-4-2) (Contact) Electrostatic discharge voltage (IEC61000-4-2) (Air) Peak pulse power (tp = 8/20 µs) Peak pulse current (tp = 8/20 µs) Junction temperature Storage temperature Symbol VESD PPK IPP Tj Tstg Note (Note 1) (Note 2) Rating ±30 ±30 80 4 150 -55 to 150 Unit kV kV W A � � Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: According to IEC61000-4-2. Note 2: According to IEC61000-4-5. 7. Electrical Characteristics (Unless otherwise specified, Ta = 25 �) VRWM: Working peak reverse voltage VBR: Reverse breakdown voltage IBR: Reverse breakdown current IR: Reverse current VC: Clamp voltage IPP: Peak pulse current RDYN: Dynamic resistance Fig. 7.1 Definitions of Electrical Characteristics Characteristics Working peak reverse voltage Total capacitance Dynamic resistance Reverse breakdown voltage Reverse current Clamp voltage Symbol VRWM Ct RDYN VBR IR VC Note (Note 1) (Note 2) (Note 3) (Note 2) Test Condition � VR = 0 V, f = 1 MHz � IBR = 1 mA VRWM = 5.5 V IPP = 1 A IPP = 4 A ITLP = 16 A ITLP = 30 A Min � � � 5.8 � � � � � Typ. � 8.5 0.2 6.8 � 8 11 12 15 Max 5.5 10 � 7.8 100 � 20 � � Unit V pF Ω V nA V Note 1: Recommended operating condition. Note 2: TLP parameters: Z0 = 50 Ω, tp = 100 ns, tr = 300 ps, averaging window: t1 = 30 ns to t2 = 60 ns, extraction of dynamic resistance using least squares fit of TLP characteristics between IPP1 = 8 A and IPP2 = 16 A. Note 3: Based on IEC61000-4-5 8/20 µs pulse. 2022-08-22 Rev.3.0 ©2016-2022 Toshiba Electronic Devices & Storage Corporation |
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