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TC7SH34F датащи(PDF) 2 Page - Toshiba Semiconductor

номер детали TC7SH34F
подробное описание детали  CMOS Digital Integrated Circuits Silicon Monolithic
PDF  7 Pages
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производитель  TOSHIBA [Toshiba Semiconductor]
домашняя страница  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC7SH34F датащи(HTML) 2 Page - Toshiba Semiconductor

  TC7SH34F Datasheet HTML 1Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 2Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 3Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 4Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 5Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 6Page - Toshiba Semiconductor TC7SH34F Datasheet HTML 7Page - Toshiba Semiconductor  
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TC7SH34F
2
4.
4.
4.
4. Marking and Pin Assignment
Marking and Pin Assignment
Marking and Pin Assignment
Marking and Pin Assignment
Marking
Marking
Marking
Marking
Pin Assignment (Top view)
Pin Assignment (Top view)
Pin Assignment (Top view)
Pin Assignment (Top view)
5.
5.
5.
5. IEC Logic Symbol
IEC Logic Symbol
IEC Logic Symbol
IEC Logic Symbol
6.
6.
6.
6. Truth Table
Truth Table
Truth Table
Truth Table
A
L
H
Y
L
H
7.
7.
7.
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Supply voltage
Input voltage
DC output voltage
Input diode current
Output diode current
DC output current
VCC/ground current
Power dissipation
Storage temperature
Symbol
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Tstg
Note
(Note 1)
Rating
-0.5 to 7.0
-0.5 to 7.0
-0.5 to VCC + 0.5
-20
±20
±25
±50
200
-65 to 150
Unit
V
mA
mW
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: VOUT < GND, VOUT > VCC
2017-12-21
Rev.3.0
©2015-2017
Toshiba Electronic Devices & Storage Corporation



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