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HT45R06 датащи(PDF) 3 Page - Holtek Semiconductor Inc

номер детали HT45R06
подробное описание детали  A/D Type 8-Bit OTP MCU
PDF  41 Pages
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производитель  HOLTEK [Holtek Semiconductor Inc]
домашняя страница  http://www.holtek.com
Logo HOLTEK - Holtek Semiconductor Inc

HT45R06 датащи(HTML) 3 Page - Holtek Semiconductor Inc

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Pin Description
Pin Name
I/O
Option
Description
PA0~PA2
PA3/PFD
PA4/TMR
PA5/INT
PA6~PA7
I/O
Pull-high
Wake-up
PFD
I/O lines with pull-high resistors (bit option). I/O modes of each line are controlled
by related control register bit (PAC).
Each line of PA can be optioned as a wake-up input (bit option).
I/O configurations: Schmitt trigger/CMOS.
The PA3, PA4 and PA5 are pin-shared with PFD, TMR and INT, respectively.
PB0/AN0~
PB3/AN3
I/O
Pull-high
I/O lines with pull-high resistors (bit option).
I/O modes of each line are controlled by related control register bit (PBC).
I/O configurations: Schmitt trigger/CMOS.
Each PB line is pin shared with an A/D converter input.
PD0
I/O
Pull-high
I/O lines with pull-high resistors (bit option).
I/O modes of each line are controlled by related control register bit (PDC).
I/O configurations: Schmitt trigger/CMOS.
OSC1
OSC2
I
O
Crystal
or RC
A resistor connected across OSC1 and VSS or a crystal across OSC1 and OSC2
will generate the system clock.
RES
¾¾
Schmitt trigger reset input. Active low.
VDD
¾¾
Positive power supply
VSS
¾¾
Negative power supply, ground.
Note: All pull-high resistors are controlled by an option bit.
Absolute Maximum Ratings
Supply Voltage ...........................VSS
-0.3V to VSS+6.0V
Storage Temperature ............................
-50°Cto125°C
Input Voltage..............................VSS
-0.3V to VDD+0.3V
Operating Temperature...........................
-40°Cto85°C
Note: These are stress ratings only. Stresses exceeding the range specified under
²Absolute Maximum Ratings² may
cause substantial damage to the device. Functional operation of this device at other conditions beyond those
listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliabil-
ity.
HT45R06
Rev. 1.00
3
May 24, 2005



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