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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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R7FA6T2AB3CFM датащи(PDF) 61 Page - Renesas Technology Corp |
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R7FA6T2AB3CFM датащи(HTML) 61 Page - Renesas Technology Corp |
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61 / 93 page  Table 2.35 A/D conversion characteristics (2 of 2) Parameter Min Typ Max Unit Test conditions High-precision channels (AN012 to AN017) Conversion time*1 (operation at ADCLK = 50 MHz) Permissible signal source impedance Max. = 50 Ω Normal conversion 0.28 — — µs ● Sampling time: 9 ADCLK ● Successive approximation time: 5 ADCLK When using averaging mode (4-time conversion) 1.12 — — µs Offset error — ±1.0 ±1.5 LSB Full-scale error — ±1.0 ±2.5 LSB Absolute accuracy Normal conversion — ±4.0 ±7.0 LSB When using averaging mode (4-time conversion) — ±3.0 ±5.5 LSB Total unadjusted error (TUE) ±3.4 ±4.4 LSB Excludes quantization error (±0.5LSB). DNL differential nonlinearity error — -1 to +1.5 -1 to +2.5 LSB INL integral nonlinearity error — ±2.0 ±3.0 LSB Normal-precision channels (AN020 to AN028) Conversion time*1 (operation at ADCLK = 50 MHz) Permissible signal source impedance Max. = 50 Ω Normal conversion 0.50 — — µs ● Sampling time: 20 ADCLK ● Successive approximation time: 5 ADCLK When using averaging mode (4-time conversion) 2.00 — — µs Offset error — ±1.0 ±2.5 LSB Full-scale error — ±1.5 ±2.5 LSB Absolute accuracy Normal conversion — ±5.5 ±8.0 LSB When using averaging mode (4-time conversion) — ±5.5 ±7.0 LSB Total unadjusted error (TUE) — ±4.2 ±5.3 LSB Excludes quantization error (±0.5LSB). DNL differential nonlinearity error — -1 to +1.5 -1 to +2.5 LSB INL integral nonlinearity error — ±2.0 ±4.0 LSB Note 1. Channel-dedicated sample-and-hold circuits in use; The conversion time is the sum of the sampling time of channel-dedicated sample-and-hold circuits, the hold mode switching time, the sampling time and the successive approximation time. Each of the above state is indicated for the test conditions. Channel-dedicated sample-and-hold circuits not in use; The conversion time is the sum of the sampling time and the successive approximation time. Each of the above state is indicated for the test conditions. Note 2. These channels cannot be used with Channel-dedicated sample-and-hold circuits. Table 2.36 A/D internal reference voltage characteristics Parameter Min Typ Max Unit Test conditions A/D internal reference voltage 1.13 1.18 1.23 V Sampling time 4.15 — — µs Table 2.37 A/D conversion characteristics of D/A output Parameter Min Typ Max Unit Test conditions Sampling time 1 — — µs RA6T2 Datasheet 2. Electrical Characteristics R01DS0400EJ0120 Rev.1.20 Mar 31, 2022 Page 61 of 93 |
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