PPC5604BAMLL4R datasheet(31/109 Pages) NXP

31 / 109 page

Package pinouts and signal descriptions

MPC5604B/C Microcontroller Data Sheet, Rev. 15

NXP Semiconductors

2.8

Electrical characteristics

2.9

Introduction

This section contains electrical characteristics of the device as well as temperature and power

considerations.

This product contains devices to protect the inputs against damage due to high static voltages. However,

it is advisable to take precautions to avoid applying any voltage higher than the specified maximum rated

voltages.

To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS). This

could be done by the internal pull-up and pull-down, which is provided by the product for most general

purpose pins.

The parameters listed in the following tables represent the characteristics of the device and its demands on

the system.

In the tables where the device logic provides signals with their respective timing characteristics, the

symbol “CC” for Controller Characteristics is included in the Symbol column.

In the tables where the external system must provide signals with their respective timing characteristics to

the device, the symbol “SR” for System Requirement is included in the Symbol column.

2.10

Parameter classification

The electrical parameters shown in this supplement are guaranteed by various methods. To give the

customer a better understanding, the classifications listed in Table 7 are used and the parameters are tagged

accordingly in the tables where appropriate.

NOTE

The classification is shown in the column labeled “C” in the parameter

tables where appropriate.

Table 7. Parameter classifications

Classification tag

Tag description

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically

relevant sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from typical

devices under typical conditions unless otherwise noted. All values shown in the typical column

are within this category.

Those parameters are derived mainly from simulations.

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