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ST25TV02K датащи(PDF) 73 Page - STMicroelectronics |
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ST25TV02K датащи(HTML) 73 Page - STMicroelectronics |
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73 / 90 page ![]() Symbol Parameter Condition(1)(2) Min Typ Max Unit tPWD_FAIL (5) Waiting time in case of wrong password - 5.12 - - ms CTUN_ 23.5pF Internal tuning capacitor in SO8 (6) f = 13.56 MHz 21.4 23 24.6 pF CTUN_ 99 pF Internal tuning capacitor in SO8(6) f = 13.56 MHz 92.7 99.7 106.7 pF VBACK Backscattered level as defined by ISO test - 10 - - mV VMIN_1 (3) RF input voltage amplitude between AC0 and AC1, VAC0-VAC1 peak to peak(3) Inventory and Read operations - 4.8 - Vpkpk Write operations - 6 - Vpkpk tRF_OFF RF OFF time Chip reset 2 - - ms Rclosed Resistance of closed Tamper Detect Loop TD0-TD1 - - 50 Ω Ropen Resistance of open Tamper Detect Loop TD0-TD1 1 - - MΩ 1. TA =–40 to 85 °C. Characterized only. 2. All timing characterizations were performed on a reference antenna with the following characteristics: • ISO antenna class1 • Tuning frequency = 13.7 MHz 3. Characterized on bench. 4. For VCD request coded in 1 out of 4 and ST25TV02K/512 response in high data rate, single sub carrier. 5. Applies from VCD request EOF to VICC response SOF. 6. The tuning capacitance value is measured with ST characterization equipment at chip Power On Reset. This value is used as reference for antenna design. Minimum and Maximum values come from correlation with industrial tester limits. For inlay implementation, the antenna design applied for LRI2K can be re-used as-is for ST25TV02K. The typical value for the ST25TV02K is equivalent to what was specified in the LRI2K data-sheet. This change is related to a different measurement methodology between LRI2K and ST25TV02K. Figure 29. ASK modulated signal A B tRFF tRFR tRFSBL tM IN CD fCC ST25TV02K ST25TV512 RF electrical parameters DS12074 - Rev 11 page 73/90 |
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