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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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UCS2113 датащи(PDF) 9 Page - Microchip Technology |
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UCS2113 датащи(HTML) 9 Page - Microchip Technology |
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9 / 62 page  2016-2021 Microchip Technology Inc. and its subsidiaries DS20005680B-page 9 UCS2113 1.1 ESD and Transient Performance 1.1.1 HUMAN BODY MODEL (HBM) PERFORMANCE HBM testing verifies the ability to withstand ESD strikes, like those that occur during handling and manufacturing, and is done without power applied to the IC. To pass the test, the device must have no change in operation or performance due to the event. 1.1.2 CHARGED DEVICE MODEL (CDM) PERFORMANCE CDM testing verifies the ability to withstand ESD strikes, like those that occur during handling and assembly, with pick-and-place-style machinery and is done without power applied to the IC. To pass the test, the device must have no change in operation or performance due to the event. TABLE 1-4: ESD RATINGS ESD Specification Rating or Value Human Body Model (JEDEC JESD22-A114) - All pins 8 kV Charged Device Model (JEDEC JESD22-C101) - All pins 500V |
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