2048-bits Serial Electrically Erasable PROM

AM93LC56

Anachip Corp.

www.anachip.com.tw

Rev. A1 Oct 20, 2003

3/10

ATC

AM93LC56

Parameter

Symbol

Conditions

Min

Max

Units

SK Clock Frequency

0

1

MHz

SK High Time

250

ns

SK Low Time

250

ns

Minimum CS Low Time

250

ns

CS Setup Time

Relative to SK

50

ns

DI Setup Time

Relative to SK

100

ns

CS Hold Time

Relative to SK

0

ns

DI Hold Time

Relative to SK

100

ns

Output Delay to "1"

AC Test

500

ns

Output Delay to "0"

AC Test

500

ns

CS to Status Valid

AC Test CL = 100pF

500

ns

CS to DO in 3-state

CS = VIL

100

ns

Write Cycle Time

10

ms

5V, 25ºC, Page Mode

Endurance**

1M

write cycles

Note** : The parameter is characterized and isn’t 100% tested.

FIGURE 1. AC TEST CONDITIONS

632 ohm

DO

1.247V

(1 TTL Gate Load)

100PF

Instruction Set

Address

Input Data

Instruction

Start

Bit

OP

Code

×

8

×

16

×

8

×

16

READ

1

10

WEN (Write Enable)

1

00

11 XXXXXX

11XXXXX

WRITE

1

01

WRALL (Write All Registers)

1

00

01XXXXXX

01XXXXX

WDS (Write Disable)

1

00

00 XXXXXX

00XXXXX

ERASE

1

11

ERAL (Erase All Registers)

1

00

10 XXXXXX

10XXXXX