2.3 GHz Dual Integrated DCL with PPMU, Level

Setting DACs, and On-Chip Calibration Registers

Data Sheet

ADATE334

Rev. Sp0

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FEATURES

2.3 GHz, 4.6 Gbps maximum toggle rate

DCL disable mode (low leakage typically <5 nA)

2 W power dissipation per channel (high voltage driver

active)

Integrated 16-bit DACs with offset and gain correction

High voltage driver

3-level driver with high-Z and reflection clamps

Voltage range: −1.5 V to +7.0 V

Precision trimmed output resistance

Functional amplitude (VIH − VIL, unterminated swing):

0.05 V (minimum) to 8.5 V (maximum)

400 ps minimum pulse width, 2.0 V programmed swing

25 ps deterministic jitter, 1 ps random jitter

Low voltage driver

Multilevel voltage range: −1.5 V to +6.5 V

Terminated swings of 25 mV p-p to 600 mV p-p into 50 Ω

215 ps minimum pulse width, 1.2 V programmed swing

20 ps deterministic jitter, 1 ps random jitter

Comparator

Normal window (NWC), differential mode (DMC), and zero-

crossing (ZCC)

Voltage range: −1.5 V to +6.5 V

<60 ps ERT/EFT NWC 1.0V, terminated

Active load: ±25 mA current range

Per pin PPMU

Force voltage and compliance range: −1.5 V to +6.5 V

5 current ranges (Range A to Range E)

±

60 mA, ±1 mA, ±100 μA, ±10 µA, and ±2 µA

Dedicated go/no go comparators

DC levels

Fully integrated and dedicated 16-bit DACs

On-chip gain and offset calibration registers with

automatic add/multiply function

On-chip temperature sensor, OVD alarms, temperature

alarm, and relay driver functions

9 mm × 9 mm, 121-ball CSP_BGA

APPLICATIONS

ATE

Semiconductor and board test systems

Instrumentation and characterization equipment

GENERAL DESCRIPTION

The ADATE334 is a complete dual-channel automatic test

equipment (ATE) solution that performs the pin electronics

functions of a driver, comparator, and active load (DCL), and a

four-quadrant per pin parametric measurement unit (PPMU).

Dedicated, 16-bit DACs with on-chip calibration registers

provide all necessary dc levels for device operation.

The high voltage driver features three active states: high mode,

low mode, and terminate mode, as well as a high impedance

inhibit state. The inhibit state, in conjunction with the integrated

dynamic clamps, facilitates significant attenuation of transmission

line reflections when the driver is not actively terminating the

line. The open-circuit drive capability is −1.5 V to +7.0 V to

accommodate a wide range of ATE and instrumentation

applications.

The low voltage driver, working in conjunction with the high

voltage driver, can provide 25 mV p-p to 600 mV p-p signals at

up to 4.6 Gbps in a 50 Ω environment.

The ADATE334 can be used either as a dual, single-ended pin

electronics channel or as a single differential channel. In addition

to per-channel, high speed window comparators, the ADATE334

provides a programmable threshold differential comparator for

differential ATE applications and a zero-crossing comparator.

All dc levels for DCL and PPMU functions are generated by

dedicated, on-chip, 16-bit DACs. To facilitate accurate level

programming, the ADATE334 includes an integrated calibration

function that corrects gain and offset errors of each functional

block. Correction coefficients can be stored on-chip, and any

values written to the DACs automatically adjust using the

appropriate correction factors.

The ADATE334 uses a serial programmable interface (SPI) bus

to program all functional blocks, DACs, and on-chip calibration

constants. The ADATE334 has an on-chip temperature sensor to

monitor temperature and overvoltage and undervoltage alarms

that monitor and report any output pin or transient PPMU

voltage faults that can occur during operation. The ADATE334

also provides a per channel, open-drain relay driver.

For more information on the ADATE334, contact

ADATE334@anlaog.com.