LMV792 datasheet(4/21 Pages) NSC

4 / 21 page

5V Electrical Characteristics (Continued)

OUT

Output Swing High

LOAD =2k

Ω to V+/2

mV from

rail

LOAD =10k

Ω to V+/2

Output Swing Low

LOAD =2k

Ω to V+/2

LMV791

LMV792

LOAD =10k

Ω to V+/2

OUT

Output Short Circuit Current

Sourcing to V

−

IN = 200 mV (Note 9)

Sinking to V

IN = –200 mV (Note 9)

Supply Current per Amplifier

Enable Mode

≥ 4.6V

LMV791

1.15

1.40

1.75

LMV792

per channel

1.30

1.70

2.05

Shutdown Mode (V

≤ 0.4V)

0.14

µA

Slew Rate

V = +1, Rising (10% to 90%)

6.0

9.5

V/µs

V = +1, Falling (90% to 10%)

7.5

11.5

GBWP

Gain Bandwidth Product

MHz

Input-Referred Voltage Noise

f = 1 kHz

5.8

nV/

Input-Referred Current Noise

f = 1 kHz

0.01

pA/

Turn-on Time

110

off

Turn-off Time

800

Enable Pin Voltage Range

Enable Mode

4.6

4.5 to 5

Shutdown Mode

0 to 0.5

0.4

Enable Pin Input Current

Enable Mode V

EN = 5.0V

(Note 7)

5.6

µA

Shutdown Mode V

EN =0V

(Note 7)

0.005

0.2

THD+N

Total Harmonic Distortion +

Noise

f = 1 kHz, A

V =1,RLOAD = 600

Ω

0.01

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables.

Note 2: Human Body Model is 1.5 k

Ω in series with 100 pF. Machine Model is 0Ω in series with 200 pF

Note 3: The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is

PD =(TJ(MAX) -TA)/θJA. All numbers apply for packages soldered directly onto a PC Board.

Note 4: Typical values represent the parametric norm at the time of characterization.

Note 5: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlations using the statistical quality

control (SQC) method.

Note 6: Offset voltage average drift is determined by dividing the change in VOS by temperature change.

Note 7: Positive current corresponds to current flowing into the device.

Note 8: Input bias current and input offset current are guaranteed by design

Note 9: The short circuit test is a momentary test, the short circuit duration is 1.5 ms.

LMV792 датащи(PDF) 4 Page - National Semiconductor (TI)

LMV792 датащи(HTML) 4 Page - National Semiconductor (TI)

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21

датащи скачать

ссылки URL