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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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IMXRT1024CEC датащи(PDF) 39 Page - NXP Semiconductors |
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IMXRT1024CEC датащи(HTML) 39 Page - NXP Semiconductors |
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39 / 90 page  Electrical characteristics i.MX RT1024 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 11/2020 NXP Semiconductors 39 4.4.4 Debug trace timing specifications Figure 14. ARM_TRACE_CLK specifications SJ9 JTAG_TMS, JTAG_TDI data hold time 25 — ns SJ10 JTAG_TCK low to JTAG_TDO data valid — 44 ns SJ11 JTAG_TCK low to JTAG_TDO high impedance — 44 ns SJ12 JTAG_TRST_B assert time 100 — ns SJ13 JTAG_TRST_B set-up time to JTAG_TCK low 40 — ns 1 TDC = target frequency of SJC 2 VM = mid-point voltage Table 30. Debug trace operating behaviors Symbol Description Min Max Unit T1 ARM_TRACE_CLK frequency of operation — 70 MHz T2 ARM_TRACE_CLK period 1/T1 — MHz T3 Low pulse width 6 — ns T4 High pulse width 6 — ns T5 Clock and data rise time — 1 ns T6 Clock and data fall time — 1 ns T7 Data setup 2 — ns T8 Data hold 0.7 — ns Table 29. JTAG timing (continued) ID Parameter1,2 All frequencies Unit Min Max T4 T6 |
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