Copyright

 ANPEC Electronics Corp.

Rev. A.4 - Jun., 2003

APL1086

www.anpec.com.tw

13

Reliability test program

Test item

Method

Description

SOLDERABILITY

MIL-STD-883D-2003

245

°C , 5 SEC

HOLT

MIL-STD-883D-1005.7

1000 Hrs Bias @ 125

°C

PCT

JESD-22-B, A102

168 Hrs, 100 % RH , 121

°C

TST

MIL-STD-883D-1011.9

-65

°C ~ 150°C, 200 Cycles

ESD

MIL-STD-883D-3015.7

VHBM > 2KV, VMM > 200V

Latch-Up

JESD 78

10ms , I

t

Ao

E

W

Po

P

Ko

Bo

D1

D

F

P1

Carrier Tape & Reel Dimensions

A

J

B

T2

T1

C

Application

A

B

C

J

T1

T2

W

P

E

330

±3

100

± 2 13 ± 0. 5 2 ± 0.5 16.4 + 0.3

-0.2

2.5

± 0.5 16+ 0.3

- 0.1

8

± 0.1 1.75± 0.1

F

D

D1

Po

P1

Ao

Bo

Ko

t

TO-252

7.5

± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 6.8 ± 0.1 10.4± 0.1 2.5± 0.1 0.3±0.05

Application

A

B

C

J

T1

T2

W

P

E

380

±3

80

± 2

13

± 0. 5 2 ± 0.5

24

± 42± 0.3

24 + 0.3

- 0.1

16

± 0.1 1.75± 0.1

F

D

D1

Po

P1

Ao

Bo

Ko

t

TO-263

11.5

± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 10.8 ± 0.1 16.1± 0.1 5.2± 0.1 0.35±0.01

3

(mm)