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TMP144YMTR датащи(PDF) 5 Page - Texas Instruments

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номер детали TMP144YMTR
подробное описание детали  TMP144 Low-Power, Digital Temperature Sensor With SMAART Wire??/ UART Interface
PDF  37 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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TMP144YMTR датащи(HTML) 5 Page - Texas Instruments

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Over free-air temperature range and V+ = 1.4 V to 3.6 V (unless otherwise noted); Typical specifications are at TA = 25 °C
and V+ = 3.3 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TRES
Temperature resolution
Including sign bit
12
Bits
LSB
62.5
m°C
TREPEAT Repeatability(2)
VDD = 3.3 V
1-Hz conversion cycle
TBD
LSB
TLTD
Long-term stability and drift
300 hours at 150°C(3)
TBD
°C
THYST
Temperature cycling and
hysteresis(4)
TBD
LSB
tCONV
Conversion time
One-shot mode
26
35
ms
tCONV_P Conversion Period
CR1 = 0, CR0 = 0 (default)
4
s
CR1 = 0, CR0 = 1
1
s
CR1 = 1, CR0 = 0
0.25
s
CR1 = 1, CR0 = 1
0.125
s
tVAR
Timing variation of all device
settings
TBD
%
tRESP_L Response time (Stirred Liquid)
Unmounted
(Single layer Flex PCB)
τ = 63 %
25 °C to 75 °C
TBD
ms
Mounted
(2-layer 62-mil PCB)
TBD
ms
DIGITAL INPUT/OUTPUT
CIN
Input capacitance
Baud Rate = 57600 bps
TBD
pF
RON
Output driver impedance
RX
TBD
Ω
VIH
Input logic high level
TX
0.7 × (V+)
(V+) + 0.3
V
VIL
Input logic low level
TX
–0.5
0.3 × (V+)
V
IIN
Input leakage current
0 ≤ VIN ≤ (V+) + 0.3V
–1
1
μA
VOL
Output low level
RX, V+ > 2V, IOH = 1 mA
0
0.4
V
RX, V+ < 2V, IOH = 1 mA
0
0.2 × (V+)
V
VOH
Output high level
RX, V+ > 2V, IOL = 1 mA
(V+) – 0.4
V+
V
RX, V+ < 2V, IOL = 1 mA
0.8 × (V+)
V+
V
POWER SUPPLY
IDD_ACTI
VE
Supply current during active
conversion
Active Conversion, serial bus inactive
TBD
TBD
μA
IDD_AVG Average current consumption
V+ = 3.3V, CR1 = 0, CR0
= 0 (default)
Serial bus inactive
3
10
μA
Serial bus active
53
IDD_SB
Standby current(5)
Serial bus inactive.
TBD
TBD
μA
IDD_SD
Shutdown current
Serial bus inactive. V+ = 3.3V
0.6
5
μA
VPOR
Power-on reset threshold
voltage
Supply rising
0.9
V
Brownout detect
Supply falling
TBD
V
tRAMP_V
DD
VDD ramp time requirements
Supply rising or falling
1
ms
(1)
Does not include effects of self heating.
(2)
Repeatability is the ability to reproduce a reading when the measured temperature is applied consecutively, under the same conditions.
(3)
Long term stability is determined using accelerated operational life testing at a junction temperature of 150 °C.
(4)
Hysteresis is defined as the ability to reproduce a temperature reading as the temperature varies from room → hot
→room→cold→room. The temperatures used for this test are –40 °C, 25 °C, and 150 °C.
(5)
Quiescent current between conversions
www.ti.com
TMP144
SBOS891A – OCTOBER 2018 – REVISED FEBRUARY 2021
Copyright © 2021 Texas Instruments Incorporated
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Product Folder Links: TMP144



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