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TMP144YMTR датащи(PDF) 5 Page - Texas Instruments |
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TMP144YMTR датащи(HTML) 5 Page - Texas Instruments |
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5 / 37 page ![]() Over free-air temperature range and V+ = 1.4 V to 3.6 V (unless otherwise noted); Typical specifications are at TA = 25 °C and V+ = 3.3 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TRES Temperature resolution Including sign bit 12 Bits LSB 62.5 m°C TREPEAT Repeatability(2) VDD = 3.3 V 1-Hz conversion cycle TBD LSB TLTD Long-term stability and drift 300 hours at 150°C(3) TBD °C THYST Temperature cycling and hysteresis(4) TBD LSB tCONV Conversion time One-shot mode 26 35 ms tCONV_P Conversion Period CR1 = 0, CR0 = 0 (default) 4 s CR1 = 0, CR0 = 1 1 s CR1 = 1, CR0 = 0 0.25 s CR1 = 1, CR0 = 1 0.125 s tVAR Timing variation of all device settings TBD % tRESP_L Response time (Stirred Liquid) Unmounted (Single layer Flex PCB) τ = 63 % 25 °C to 75 °C TBD ms Mounted (2-layer 62-mil PCB) TBD ms DIGITAL INPUT/OUTPUT CIN Input capacitance Baud Rate = 57600 bps TBD pF RON Output driver impedance RX TBD Ω VIH Input logic high level TX 0.7 × (V+) (V+) + 0.3 V VIL Input logic low level TX –0.5 0.3 × (V+) V IIN Input leakage current 0 ≤ VIN ≤ (V+) + 0.3V –1 1 μA VOL Output low level RX, V+ > 2V, IOH = 1 mA 0 0.4 V RX, V+ < 2V, IOH = 1 mA 0 0.2 × (V+) V VOH Output high level RX, V+ > 2V, IOL = 1 mA (V+) – 0.4 V+ V RX, V+ < 2V, IOL = 1 mA 0.8 × (V+) V+ V POWER SUPPLY IDD_ACTI VE Supply current during active conversion Active Conversion, serial bus inactive TBD TBD μA IDD_AVG Average current consumption V+ = 3.3V, CR1 = 0, CR0 = 0 (default) Serial bus inactive 3 10 μA Serial bus active 53 IDD_SB Standby current(5) Serial bus inactive. TBD TBD μA IDD_SD Shutdown current Serial bus inactive. V+ = 3.3V 0.6 5 μA VPOR Power-on reset threshold voltage Supply rising 0.9 V Brownout detect Supply falling TBD V tRAMP_V DD VDD ramp time requirements Supply rising or falling 1 ms (1) Does not include effects of self heating. (2) Repeatability is the ability to reproduce a reading when the measured temperature is applied consecutively, under the same conditions. (3) Long term stability is determined using accelerated operational life testing at a junction temperature of 150 °C. (4) Hysteresis is defined as the ability to reproduce a temperature reading as the temperature varies from room → hot →room→cold→room. The temperatures used for this test are –40 °C, 25 °C, and 150 °C. (5) Quiescent current between conversions www.ti.com TMP144 SBOS891A – OCTOBER 2018 – REVISED FEBRUARY 2021 Copyright © 2021 Texas Instruments Incorporated Submit Document Feedback 5 Product Folder Links: TMP144 |
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