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FSV1045V датащи(PDF) 2 Page - ON Semiconductor |
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FSV1045V датащи(HTML) 2 Page - ON Semiconductor |
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2 / 6 page ![]() FSV1045V www.onsemi.com 2 ABSOLUTE MAXIMUM RATINGS (Note 1) Symbol Parameter Value Unit VRRM Peak Repetitive Reverse Voltage 45 V VRWM Working Peak Reverse Voltage 45 V VRMS RMS Reverse Voltage 32 V VR DC Blocking Voltage 45 V IO Average Rectified Output Current (Note 2) TL = 105°C 10 A IFSM Non−Repetitive Peak Forward Surge Current (Note 3) 300 A CJ Typical Junction Capacitance VR = 4 V, 1 MHz 820 pF TJ Operating Junction Temperature Range −55 to +150 °C TSTG Storage Temperature Range −55 to +150 °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. All test conducted at TA = TJ = 25°C unless otherwise noted 2. Mounted on 30 mm x 30 mm FR4 PCB 3. Pulse condition: 8.3 ms half−sine wave. Test method is compliant with MIL standard (MIL−STD−750E) THERMAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Note 4) Symbol Parameter Minimum Land Pattern Maximum Land Pattern Unit RqJA Junction−to−Ambient Thermal Resistance 100 40 °C/W ΨJL Junction−to−Lead Thermal Characteristics, Thermocouple Soldered to Anode 15 12 °C/W Junction−to−Lead Thermal Characteristics, Thermocouple Soldered to Cathode 6 5 4. The thermal resistances (RqJA & ΨJL) are characterized with device mounted on the following FR4 printed circuit boards, as shown in Figure 1 and Figure 2. PCB size: 76.2 x 114.3 mm. Minimum land pattern size: 4.9 x 4.8 mm (big pattern, x1), 1.4 x 1.52 mm (small pattern, x2). Maximum land pattern size: 30 x 30 mm (pattern, x2). Force line trace size = 55 mils, sense line trace size = 4 mils. Figure 1. Minimum Land Pattern of 2 oz Copper Figure 2. Maximum Land Pattern of 2 oz Copper F S F S F S F S F S |
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