Unless otherwise specified, all limits are guaranteed for T

Ω to V

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

(Note 6)

Typ

(Note 5)

Max

(Note 6)

Units

V

OS

Input Offset Voltage

µV

TCV

OS

Input Offset Voltage Drift

(Note 7)

µV/˚C

I

B

Input Bias Current

(Notes 7, 8)

0.3

10

300

pA

I

OS

Input Offset Current

40

fA

CMRR

Common Mode Rejection Ratio

–5V

≤ V

CM

≤ 5V

92

88

110

dB

PSRR

Power Supply Rejection Ratio

2.7V

CM

86

82

98

dB

CMVR

Input Common-Mode Voltage

Range

CMRR

≥ 80 dB

CMRR

≥ 78dB

–5.2

–5.2

5.2

5.2

V

A

VOL

Large Signal Voltage Gain

R

Ω

V

100

98

121

dB

R

Ω

V

100

98

134

V

O

Output Swing High

R

Ω to V

CM

4.85

4.83

4.91

V

R

Ω to V

CM

4.92

4.90

4.96

Output Swing Low

R

Ω to V

CM

−4.91

−4.87

-4.85

V

R

Ω to V

CM

−4.96

−4.95

-4.94

I

O

Output Short Circuit Current

(Notes 3, 9)

Sourcing V

V

50

35

86

mA

Sinking V

V

50

35

84

I

S

Supply Current

0.790

1.1

1.3

mA

SR

Slew Rate (Note 10)

A

10% to 90%

1.1

V/µs

GBW

Gain Bandwidth Product

2.5

MHz

THD+N

Total Harmonic Distortion + Noise

f = 1 kHz, Av = 1, R

Ω

0.02

%

e

n

Input-Referred Voltage Noise

f = 1 kHz

12

nV/

i

n

Input-Referred Current Noise

f = 100 kHz

1

fA/

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables.

Note 2: Human Body Model: 1.5 k

Ω in series with 100 pF. Machine Model: 0Ω in series with 200 pF.

Note 4: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of

the device.

Note 5: Typical values represent the parametric norm at the time of characterization.

Note 6: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlations using the Statistical Quality

Control (SQC) method.

Note 7: Guaranteed by design.

Note 8: Positive current corresponds to current flowing into the device.

Note 9: The short circuit test is a momentary test.

Note 10: The number specified is the slower of positive and negative slew rates.

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