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MLV_VZ датащи(PDF) 4 Page - WALSIN TECHNOLOGY CORPORATION |
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MLV_VZ датащи(HTML) 4 Page - WALSIN TECHNOLOGY CORPORATION |
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4 / 49 page ![]() Approval sheet Page 4 of 7 ASC_VZ0402 Green Series- V14 Aug. 2018 Chip varistor SPECIFICATION 1. Electrical Reliability Test item Test condition / Test method Specification High temperature storage +125±3℃ for 1000 hours Measurement to be made after keeping at room temp. for 24 ±2hr △V at 1mA < 10% Low temperature storage -40±3℃ for 1000 hours Measurement to be made after keeping at room temp. for 24 ±2hr △V at 1mA < 10% Humidity storage 40±2℃ , 90 ~95%RH for 500 hours Measurement to be made after keeping at room temp. for 24 ±2hr △V at 1mA < 10% Temperature cycles Times:5 cycles Step Temp.(℃) Time(min.) 1 -55±3 30±3 2 room temp. 2~3 3 +125±3℃ 30±2 4 room temp. 2~3 Measurement to be made after keeping at room temp. for 24 ±2hr △V at 1mA < 10% 2. Mechanical Reliability Test item Test condition / Test method Specification Solderability Solder temp.:230±5 C Immersion time:2±0.5 sec Immersion and emersion rates:25mm/s Min 90% electrode shall be covered with solder. Resistance to Soldering Heat Pre-heating:120~ 150℃ , 60 sec Solder temp.:260±5 C Immersion time:10±1 sec Measurement to be made after keeping at room temp. for 24 ±2h △V at 1mA < 10% Disappearance of electrode due to immersion into solder shall not exceed 25% of edges of each electrode. Adhesive Strength of Termination Solder chip on PCB and applied 0805/1206 Series: 10N(1Kgf) for 10 sec No visible damage 0402/0603 Series: 5N(0.5Kgf) for 10 sec Vibration Solder chip on PCB. Frequency:10 Hz~55 Hz~10 Hz (1min) Oscillation amplitude:1.5 mm Times:2 hrs in each of three perpendicular direction No visible damage Bending Test The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of 1mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5 sec.. No visible damage △V at 1mA < 10% |
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