TMS27C020 262144 BY 8-BIT UV ERASABLE

TMS27PC020 262144 BY 8-BIT

PROGRAMMABLE READ-ONLY MEMORIES

SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997

8

POST OFFICE BOX 1443

capacitance over recommended ranges of supply voltage and operating free-air temperature,

PARAMETER

TEST CONDITIONS

MIN

NOM‡

MAX

UNIT

CI

Input capacitance

VI = 0 V,

f = 1 MHz

4

8

pF

CO

Output capacitance

VO = 0 V,

f = 1 MHz

6

10

pF

† Capacitance measurements are made on sample basis only.

‡ All typical values are at TA = 25°C and nominal voltages.

switching characteristics over full ranges of recommended operating conditions (see Notes 3

and 4)

TEST

’27C020-10

’27C020-12

’27C020-15

27C020-20

’27C020-25

PARAMETER

TEST

CONDITIONS

’27PC020-10

’27PC020-12

’27PC020-15

27PC020-20

’27PC020-25

UNIT

CONDITIONS

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

ta(A)

Access

time

from address

100

120

150

200

250

ns

ta(E)

Access

time

from chip en-

able

100

120

150

200

250

ns

ten(G)

Output

enable

time from G

CL = 100 pF,

1 Series 74

55

55

75

75

100

ns

tdis

Output disable

time from G or

E,

whichever

occurs first†

1 Series 74

TTL load,

Input tr ≤ 20 ns,

Input tf ≤ 20 ns

0

50

0

50

0

60

0

60

0

80

ns

tv(A)

Output data

valid time after

change of ad-

dress, E, or G,

whichever oc-

curs first§

0

0

0

0

0

ns

§ Value calculated from 0.5-V delta to measured output level. This parameter is sampled and not 100% tested.

NOTES:

3. For all switching characteristics, the input pulse levels are 0.4 V to 2.4 V. Timing measurements are made at 2 V for logic high

and 0.8 V for logic low. (See Figure 2).

4. Common test conditions apply for tdis except during programming.