IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.

IXFQ28N60P3

IXFH28N60P3

IXYS MOSFETs and IGBTs are covered

4,835,592

4,931,844

5,049,961

5,237,481

6,162,665

6,404,065 B1

6,683,344

6,727,585

7,005,734 B2

7,157,338B2

by one or more of the following U.S. patents: 4,860,072

5,017,508

5,063,307

5,381,025

6,259,123 B1

6,534,343

6,710,405 B2 6,759,692

7,063,975 B2

4,881,106

5,034,796

5,187,117

5,486,715

6,306,728 B1

6,583,505

6,710,463

6,771,478 B2 7,071,537

Note

1. Pulse test, t

 300s, duty cycle, d  2%.

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

g

fs

V

18

30

S

C

iss

3560

pF

C

oss

V

GS

= 0V, V

360

pF

C

rss

3.3

pF

R

Gi

Gate Input Resistance

1.5



t

d(on)

27

ns

t

r

18

ns

t

d(off)

48

ns

t

f

19

ns

Q

g(on)

50

nC

Q

gs

V

17

nC

Q

gd

14

nC

R

thJC

0.18

C/W

R

thCS

0.25

C/W

Source-Drain Diode

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

I

S

V

28

A

I

SM

Repetitive, Pulse Width Limited by T

JM

112

A

V

SD

I

1.4

V

t

rr

250

ns

I

RM

9.0

A

Q

RM

0.8

μC

I

V

Resistive Switching Times

V

R