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830S датащи(PDF) 3 Page - KIA Semiconductor Technology |
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830S датащи(HTML) 3 Page - KIA Semiconductor Technology |
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3 / 7 page ![]() 5A,550V N-CHANNEL MOSFET KIA SEMICONDUCTORS 830S KIA SEMICONDUCTORS KIA SEMICONDUCTORS 6. Electrical characteristics (TJ=25°C,unless otherwise specified) Parameter Symbol Test Conditions Min Typ Max Units Drain-source breakdown voltage BVDSS VGS=0V,IDS=250μA 550 - - V Breakdown voltage temperature coeffcient, Figure 11 △BVDSS/△ TJ Reference to 25℃ ID=250uA 0.61 V/℃ Drain-source leakage current IDSS VDS=500V,VGS=0V - - 1 μA VDS=400V,VGS=0V TJ=125°C - - 10 Gate threshold voltage,Figure 12 VGS(th) VDS=VGS,ID=250μA 2 - 4 V Gate-source forward leakage IGSS VGS=20V - - 1 uA Gate-source reverse leakage VGS=-20V - - -1 Static drain-source on-resistance Figure 9 and 10 RDS(on) VGS=10V,ID=2.5A - 1.0 1.2 Ω Forward transconductance gfs VDS=40V,ID=2.5A (note4) - 3 - S Input capacitance Ciss VDS=25V,VGS=0V f=1MHz - 682 - pF Output capacitance Coss - 23 - Reverse transfer capacitance Crss - 9 - Turn-on delay time td(on) VDD=275V,ID=5A, RG=25Ω,(note4,5) - 25 - ns Rise time tr - 23 - Turn-off delay time td(off) - 92.5 - Fall time tf - 47 - Total gate charge Qg VDD=440V,ID=5A, VGS=10V,(note4,5) - 16.3 - nC Gate-source charge Qgs - 3.6 - Gate-drain charge Qgd - 5.1 - Continuous source current(body biode) IS Integral pn-diode in MOSFET - - 5 A Maximum pulsed current(body biode) ISM - - 20 Diode forward voltage VSD IS=5A,VGS=0V - - 1.4 V Reverse recovery time trr IF=5A,VGS=0V di/dt=100A/ μs(note4) - 312 - nS Reverse recovery charge Qrr - 2.1 - uC Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 12mH,IAS = 5.0A,VDD = 50V,RG= 25 Ω, StartingTJ= 25°C 3.ISD<5.0A, di/dt<200A/ μs,VDD <BVDSS,StartingTJ= 25°C 4. Pulse Test : Pulse width<300us, Duty cycle<2% 5. Essentially independent of operating temperature 3 of7 Rev 1.0 Aug 2015 |
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