TPS16632RGET datasheet(19/42 Pages) TI1

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VOUT

IIN

IMON

FLTb

TPS1663

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SLVSET9C – SEPTEMBER 2018 – REVISED MARCH 2019

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Feature Description (continued)

VIN = 50 V

RILIM = 18 kΩ

Figure 22. Output Hot-Short Response

The fast-trip comparator architecture has a supply line noise immunity resulting in a robust performance in noisy

environments. This is achieved by controlling the turn OFF time of the internal FET based on the overcurrent

level, I(FASTTRIP) through the device. Higher the overcurrent, faster the turn OFF time, tFASTTRIP(dly). At Overload

current level in the range of IFASTTRIP < IOUT < ISCP the fast-trip comparator response is 3.2 µs (typical).

9.3.4.2.1

Start-Up With Short-Circuit On Output

When the device is started with short-circuit on the output, the current begins to limit at I(OL). Due to high power

dissipation of VIN x I(OL) within the device the junction temperature increases. Subsequently, the thermal

regulation control loop limits the load current to regulate the junction temperature at T(J_REG) , 145°C (typical) for a

duration of t(Treg_timeout), 1.25 sec (typical). Subsequent operation of the device depends on the MODE

configuration (Auto-Retry or latch OFF) setting as per the Table 1. FLT gets asserted after t(Treg_timeout) and and

remains asserted till the output short-circuit is removed. Figure 23 illustrates the behavior of the device in this

condition.

TPS16632RGET датащи(PDF) 19 Page - Texas Instruments