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FS9721B датащи(PDF) 28 Page - Fortune Semiconductor Corp.

номер детали FS9721B
подробное описание детали  2,400 counts auto range DMM IC,
PDF  35 Pages
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производитель  FORTUNE [Fortune Semiconductor Corp.]
домашняя страница  https://www.ic-fortune.com/eng/index.asp
Logo FORTUNE - Fortune Semiconductor Corp.

FS9721B датащи(HTML) 28 Page - Fortune Semiconductor Corp.

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FS9721B
Rev. 1.7
28/
35
15.16 Short Circuit Testing
J5
J3
FS9721B
TENM
ONEK
SMV
SGND
AGND
PTC
1k
Continuity
COM
R26 10M
R22 1k
R19 900k
Rx
R27 10k
Diagram 29
Short Circuit Testing
Short circuit testing is proceeded in 240Ωresistance mode. 0.4V voltage (relative to AGND) is generated by
internal IC and output through R22, then add to short measuring point through PTC. J3 and J5 are mode switch
and are close during doing short circuit testing. Rx gets voltage VRx, and input IC through R19. If Rx smaller
than 50Ω, the beeper will sound.
15.17 Capacitance Measurement
R21
57.4k
R19
900k
RCAP
SMV
SGND
PTC
500
Cap
COM
CX
FS9721B
J3
J5
DO-
DO+
DO-
DO+
CMP
DO+
DO-
+
-
VDD
AGND
3/4VDD
1/4VDD
R27
10k
Typical Wave of Input End
3/4VDD
1/4VDD
VDD
Tdo
Diagram 30
Capacitance Measurement
Capacitance measurement is to charge/discharge to measuring capacitance through R21 to form a
oscillation, then calculate the cycle of oscillation to get the capacitance value. To adjust R21 can calibrate the
value in capacitance measurement. J3 and J5 are mode switch. When doing capitance measurement, J3 and
J5 are close.
(In actual application, if the linearity is worse when doing 2.5nF measurement, you can take a consideration of
paralleling a proximate 1000pF capacitance in input end of capacitance measurement during design. When
doing the measurement, to press REL key and make the value be zero before measuring. The linearity of the
smaller measurement in capacitance mode will be better.)



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