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FS501 датащи(PDF) 7 Page - Fortune Semiconductor Corp.

номер детали FS501
подробное описание детали  18-bit ADC with two low noise OPAMPs
PDF  31 Pages
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производитель  FORTUNE [Fortune Semiconductor Corp.]
домашняя страница  https://www.ic-fortune.com/eng/index.asp
Logo FORTUNE - Fortune Semiconductor Corp.

FS501 датащи(HTML) 7 Page - Fortune Semiconductor Corp.

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PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNITS
Instrumentation Amplifier
@ Gain = 30, Vref=0.5V, TA=25℃
Input Offset Voltage without AZ
Rs<100
20
V
Input Offset Voltage with AZ
Rs<100
0
3
V
Input Offset Drift without AZ
-20℃<TA<+50℃
200
nV/℃
Input Offset Drift with AZ
-20℃<TA<+50℃
20
nV/℃
Input Referred Noise
Rs=100
0.3
0.6
Vpp
Input Bias Current
[2]
100
300
pA
Current Consumption
180
220
A
Regulator
Analog Ground Source Capability ΔVO=-0.1V
15
20
μ
A
Analog Ground Sink Capability
Δ
VO=0.1V
3
5
mA
VBAT
5.5
9
V
Low Battery Detection Voltage
6.7
6.8
6.9
V
VDD Operating Current
VIN=0, 500mV Scale
960
μ
A
Sleep Current
10
30
μ
A
Parasitic Capacitance
10
15
pF
Digital Output High
IOUT=-1mA
5
V
Digital Output Low
IOUT=1mA
25
mV
Digital Input High
V
Digital Input Low
V
Temperature Range
Operating Temperature Range
-40
25
85
C
Storage Temperature Range
-65
25
150
C
These parameters are guaranteed by design and are tested only by sampling while mass production.
While a voltage source with large output impedance is measured by an instrumentation amplifier having input
bias current, an additional input offset voltage will be introduced. However, this offset voltage could be
cancelled by mirrored offset cancellation technique.



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