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DP8480AN датащи(PDF) 2 Page - National Semiconductor (TI) |
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DP8480AN датащи(HTML) 2 Page - National Semiconductor (TI) |
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2 / 6 page ![]() Absolute Maximum Ratings (Note 1) If MilitaryAerospace specified devices are required please contact the National Semiconductor Sales OfficeDistributors for availability and specifications VEE Supply Voltage b 8V VCC Supply Voltage 7V Input Voltage GND to VEE Output Voltage 55V Maximum Power Dissipation at 25 C Molded Package 1476 mW Storage Temperature b 65 Cto a150 C Derate molded package 118 mW C above 25 C Recommended Operating Conditions VEE Supply Voltage b 52V g10% VCC Supply Voltage 50V g10% TA Ambient Temperature 0 Cto75 C Electrical Characteristics (TTL Logic) Notes 2 3 and 4 Symbol Parameter Conditions Min Typ Max Units VOL Output Low Voltage IOL e 12 mA 05 V VOH Output High Voltage IOH eb10 mA VCC b2V V IAV Output Low Drive Current Force 25V 70 150 mA IOS Output High Drive Current Force 0V b 70 b 150 b 350 mA IOZ TRI – STATE Output Current b 50 1 a 50 m A ICC Supply Current 35 mA Electrical Characteristics (ECL Logic) Notes 2 and 3 Symbol Parameter Conditions TA Min Typ Max Units VIL Input Low Voltage VEE eb52V 0 C b 1870 b 1490 25 C b 1850 b 1475 mV 75 C b 1830 b 1450 VIH Input High Voltage VEE eb52V 0 C b 1145 b 840 25 C b 1105 b 810 mV 75 C b 1045 b 720 IIL Input Low Current VIN e VIL Max 50 125 m A IIH Input High Current VIN e VIH Max 75 750 m A IEE Supply Current b 55 mA Switching Characteristics Notes 2 and 5 Symbol Parameter Conditions Min Typ Max Units tPD1 Strobe to Output Delay CL e 50 pF 4 9 15 ns tPD2 Data to Output Delay CL e 50 pF 35 8 15 ns tS Data Set-Up Time (Note 6) 30 10 ns tH Data Hold Time (Note 6) 30 10 ns tPW Strobe Pulse Width (Note 6) 50 30 ns tZE Delay from Chip Select to CL e 50 pF 615 25 ns Active State from Hi – Z State tEZ Delay from Chip Select to Hi – Z CL e 50 pF 45 12 22 ns State from Active State Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed They are not meant to imply that the device should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation Note 2 Unless otherwise specified minmax limits apply across the 0 Cto75 C ambient temperature range in still air and across the specified supply variations All typical values are for TA e 25 C and nominal supply Maximum propagation delays are specified with all outputs switching simultaneously Note 3 All currents into device pins are shown as positive all currents out of device pins are shown as negative All voltages are referenced to ground unless otherwise specified Note 4 When DC testing IAV or IOS only one output should be tested at a time and the current limited to 120 MA max Note 5 Unless otherwise specified all AC measurements are referenced from the 50% level of the ECL input to the 08V level on negative transitions or the 24V level on positive transitions of the output ECL input rise and fall times are 20 ns g 02 ns from 20% to 80% Note 6 Caution should be used when latching data while the outputs are switching TTL outputs generate severe ground noise when switching This noise can be sufficient to cause the ECL latch to loose data Board mounting and good supply decoupling are desirable The worst case conductions are with all outputs switching low simultaneously the maximum capacitive loading on the outputs and the maximum VCC supply voltage applied 2 |
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