Notes:

1. Stresses greater than those listed under MAXIMUM RATINGS may

cause permanent damage to the device. This is a stress rating only

and functional operation of the device at these or any other conditions

above those indicated in the operational sections of this specification

is not implied. Exposure to MAXIMUM rating conditions for extended

periods may affect reliability.

2. Extended temperature operation guaranteed with 400 linear feet per

minute of air flow.

3. Transient inputs with V

V

4. This parameter is sampled and not 100% tested.

5. WE is HIGH for READ cycle.

6. CE is LOW and OE is LOW for READ cycle.

7. ADDRESS must be valid prior to, or coincident with CE transition

LOW.

8. Transition is measured ± 200 mV from steady state voltage prior

to change, with loading as specified in Figure 1. This parameter is

sampled and not 100% tested.

9. Read Cycle Time is measured from the last valid address to the first

transitioning address.

TIMING WAVEFORM OF READ CYCLE NO. 1

FTC41041

HIGH SPEED 256K x 16 (4 MEG)

STATIC CMOS RAM

2013

4 of 11

Rev C