Data Sheet

16

Rev. 1.0

2017-08-09

HS CAN Transceiver

High Speed CAN Transceiver

General product characteristics

8

General product characteristics

8.1

Absolute maximum ratings

Note:

Stresses above the ones listed here may cause permanent damage to the device. Exposure to

absolute maximum rating conditions for extended periods may affect device reliability. Integrated

protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal-operating range. Protection

functions are not designed for continuos repetitive operation.

Table 3

All voltages with respect to ground; positive current flowing into pin;

(unless otherwise specified)

1) Not subject to production test, specified by design

Parameter

Symbol

Values

Unit Note or

Test Condition

Number

Min.

Typ. Max.

Voltages

Transmitter supply voltage

-0.3

–

6.0

V

–

P_8.1.1

CANH and CANL DC voltage

versus GND

-40

–

40

V

–

P_8.1.3

Differential voltage between

CANH and CANL

-40

–

40

V

–

P_8.1.4

Voltages at the digital I/O pins:

NEN, NRM, RxD, TxD

-0.3

–

6.0

V

–

P_8.1.5

Voltages at the digital I/O pins:

NEN, NRM, RxD, TxD

-0.3

–

–

P_8.1.6

Currents

RxD output current

-5

–

5

mA –

P_8.1.7

Temperatures

Junction temperature

-40

–

150

°C

–

P_8.1.8

Storage temperature

-55

–

150

°C

–

P_8.1.9

ESD Resistivity

ESD immunity at CANH, CANL

versus GND

–

8

kV

HBM

2) ESD susceptibility, Human Body Model “HBM” according to ANSI/ESDA/JEDEC JS-001

P_8.1.11

–

2

kV

HBM

(100 pF via 1.5 kΩ)2)

P_8.1.12

ESD immunity all pins

-750

–

750

V

3) ESD susceptibility, Charge Device Model “CDM” according to EIA/JESD22-C101 or ESDA STM5.3.1

P_8.1.13