LT1027LS8

3

1027ls8f

For more information www.linear.com/LT1027LS8

elecTrical characTerisTics

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: Output voltage is measured immediately after turn-on. Changes

due to chip warm-up are typically less than 0.005%.

Note 3: Temperature coefficient is measured by dividing the change in

output voltage over the temperature range by the change in temperature.

Note 4: Line and load regulation are measured on a pulse basis. Output

changes due to die temperature change must be taken into account

separately.

Note 5: RMS noise is measured with an 8-pole bandpass filter with a

center frequency of 30Hz and a Q of 1.5. The filter output is then rectified

and integrated for a fixed time period, resulting in an average, as opposed

to RMS voltage. A correction factor is used to convert average to RMS.

This value is then used to obtain RMS noise voltage in the 10Hz to 1000Hz

frequency band. This test also screens for low frequency “popcorn” noise

within the bandwidth of the filter.

Note 6: Devices typically exhibit a slight negative DC output impedance of

–0.015Ω. This compensates for PC trace resistance, improving regulation

at the load.

SYMBOL PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Output Voltage (Note 2)

4.995

5.000

5.005

V

Output Voltage Temperature Coefficient (Note 3)

l

2

5

ppm/°C

Line Regulation (Note 4)

l

6

12

25

ppm/V

ppm/V

l

3

6

8

ppm/V

ppm/V

Load Regulation (Notes 4, 6)

Sourcing Current

l

–8

–10

–10

8

12

15

15

ppm/mA

ppm/mA

ppm/mA

0°C to 85°C

–40°C

l

30

120

160

ppm/mA

ppm/mA

Supply Current

l

2.2

3.1

3.5

mA

mA

l

±30

±50

mV

Output Noise (Note 5)

0.1Hz ≤ f ≤ 10Hz

3

10Hz ≤ f ≤ 1kHz

2.0

6.0

Long-Term Stability of Output Voltage (Note 7)

∆t = First 1000Hrs

∆t = First 3000Hrs

12

18

ppm

ppm

Temperature Hysteresis of Output (Note 8)

∆T = ±25°C

∆T = 0°C to 70°C

∆T = –40°C to 85°C

6

8

12

ppm

ppm

ppm

Note 7: Long-term stability typically has a logarithmic characteristic and

therefore, changes after 1000 hours tend to be much smaller than before

that time. Total drift in the second thousand hours is normally less than

one third that of the first thousand hours, with a continuing trend toward

reduced drift with time. Significant improvement in long-term drift can be

realized by preconditioning the IC with a 100-200 hour, 125°C burn in.

Long term stability will also be affected by differential stresses between

the IC and the board material created during board assembly. Temperature

cycling and baking of completed boards is often used to reduce these

stresses in critical applications.

Note 8: Hysteresis in output voltage is created by package stress that

differs depending on whether the IC was previously at a higher or lower

temperature. Output voltage is always measured at 25°C, but the IC is

cycled to high or low temperature before successive measurements.

Hysteresis is roughly proportional to the square of temperature change.

Hysteresis is not normally a problem for operational temperature

excursions, but can be significant in critical narrow temperature range

applications where the instrument might be stored at high or low

temperatures. Hysteresis measurements are preconditioned by one

temperature cycle.