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BT8376EPF датащи(PDF) 116 Page - Synaptics Incorporated.

номер детали BT8376EPF
подробное описание детали  single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces
PDF  323 Pages
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производитель  CONEXANT [Synaptics Incorporated.]
домашняя страница  https://www.synaptics.com/
Logo CONEXANT - Synaptics Incorporated.

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2.0 Circuit Description
Bt8370/8375/8376
2.12 Joint Test Access Group
Fully Integrated T1/E1 Framer and Line Interface
2-88
Conexant
N8370DSE
2.12 Joint Test Access Group
The Bt8370/8375/8376 incorporates printed circuit board testability circuits in
compliance with IEEE Std. P1149.1a–1993, IEEE Standard Test Access Port and
Boundary–Scan Architecture, commonly known as JTAG (Joint Test Action
Group).
The JTAG includes a Test Access Port (TAP) and several data registers. The
TAP provides a standard interface through which instructions and test data are
communicated (see Figure 2-49). A Boundary Scan Description Language
(BSDL) file for the Bt8370/8375/8376 is available from the factory upon request.
The test access port consists of the TDI, TCK, TMS, and TDO pins. An
internal power on reset circuit resets the JTAG port.
2.12.1 Instructions
In addition to the required BYPASS, SAMPLE/PRELOAD, and EXTEST
instructions, IDCODE instruction is supported. There are also two private
instructions. Table 2-25 lists the JTAG instructions, and their codes.
Figure 2-49. JTAG Diagram
JTAG Port
TCK
TMS
TDI
TDO
Table 2-25. JTAG Instructions
Instruction
Code
BYPASS
111 111
SAMPLE/PRELOAD
000 001
EXTEST
000 000
IDCODE
000 010
Private
xxx xxx
Private
xxx xxx



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