AM29PDL128G datasheet(66/69 Pages) SPANSION

66 / 69 page

July 29, 2002

Am29PDL128G

P R E L I M I NARY

ERASE AND PROGRAMMING PERFORMANCE

Notes:

1. Typical program and erase times assume the following conditions: 25

°C, 3.0 V V

CC, 1,000,000 cycles. Additionally,

programming typicals assume checkerboard pattern.

2. Under worst case conditions of 90

°C, V

CC = 2.7 V, 1,000,000 cycles.

3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes

program faster than the maximum program times listed.

4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.

5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Tables

14–17 for further information on command definitions.

6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.

LATCHUP CHARACTERISTICS

Note: Includes all pins except V

CC. Test conditions: VCC = 3.0 V, one pin at a time.

FORTIFIED BGA PACKAGE CAPACITANCE

Notes:

1. Sampled, not 100% tested.

2. Test conditions T

A = 25°C, f = 1.0 MHz.

DATA RETENTION

Parameter

Typ (Note 1)

Max (Note 2)

Unit

Comments

Sector Erase Time

0.2

sec

Excludes 00h programming

prior to erasure (Note 4)

Chip Erase Time

100

sec

Double Word Program Time

16.6

330

µs

Excludes system level

overhead (Note 5)

Word Program Time

12.6

210

µs

Accelerated Double Word Program Time

14.5

120

µs

Accelerated Word Program Time

10.5

240

µs

Chip Program Time

(Note 3)

Double Word Mode

69.6

208

sec

Word Mode

105.7

317

Description

Min

Max

Input voltage with respect to V

SS on all pins except I/O pins

(including A9, OE#, and RESET#)

–1.0 V

13 V

Input voltage with respect to V

SS on all I/O pins

–1.0 V

CC + 1.0 V

CC Current

–100 mA

+100 mA

Parameter Symbol

Parameter Description

Test Setup

Typ

Max

Unit

Input Capacitance

IN = 0

TBD

OUT

Output Capacitance

OUT = 0

TBD

IN2

Control Pin Capacitance

IN = 0

TBD

Parameter Description

Test Conditions

Min

Unit

Minimum Pattern Data Retention Time

150

°C10

Years

125

°C20

Years

AM29PDL128G датащи(PDF) 66 Page - SPANSION

AM29PDL128G датащи(HTML) 66 Page - SPANSION

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69

датащи скачать

ссылки URL