DAC7554IDGS datasheet(3/21 Pages) TI

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ELECTRICAL CHARACTERISTICS

DAC7554

SLAS399A – OCTOBER 2004 – REVISED NOVEMBER 2004

DD = 2.7 V to 5.5 V, REFIN = VDD, RL = 2 kΩ to GND; CL = 200 pF to GND; all specifications –40°C to 105°C, unless

otherwise specified

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNITS

STATIC PERFORMANCE(1)

Resolution

Bits

Relative accuracy

±0.35

±1

LSB

Differential nonlinearity

Specified monotonic by design

±0.08

± 0.5

LSB

Offset error

±12

Zero-scale error

All zeroes loaded to DAC register

±12

Gain error

±0.15

%FSR

Full-scale error

±0.5

%FSR

Zero-scale error drift

µV/

°C

Gain temperature coefficient

ppm of FSR/

°C

PSRR

VDD = 5 V

0.75

mV/V

OUTPUT CHARACTERISTICS(2)

Output voltage range

REFIN

Output voltage settling time

RL = 2 kΩ; 0 pF < CL < 200 pF

µs

Slew rate

V/µs

Capacitive load stability

RL = ∞

470

RL = 2 kΩ

1000

Digital-to-analog glitch impulse

1 LSB change around major carry

0.1

nV-s

Channel-to-channel crosstalk

1-kHz full-scale sine wave, outputs unloaded

–100

Digital feedthrough

0.1

nV-s

Output noise density (10-kHz offset fre-

nV/rtHz

quency)

Total harmonic distortion

FOUT = 1 kHz, FS = 1 MSPS, BW = 20 kHz

–85

DC output impedance

Ω

Short-circuit current

VDD = 5 V

VDD = 3 V

Power-up time

Coming out of power-down mode, VDD = 5 V

µs

Coming out of power-down mode, VDD = 3 V

LOGIC INPUTS(2)

Input current

±1

µA

VIN_L, Input low voltage

VDD = 5 V

0.3 VDD

VIN_H, Input high voltage

VDD = 3 V

0.7 VDD

Pin capacitance

POWER REQUIREMENTS

VDD

2.7

5.5

IDD(normal operation)

DAC active and excluding load current

VDD = 3.6 V to 5.5 V

VIH = VDD and VIL = GND

700

880

µA

VDD = 2.7 V to 3.6 V

550

830

IDD (all power-down modes)

VDD = 3.6 V to 5.5 V

VIH = VDD and VIL = GND

0.2

µA

VDD = 2.7 V to 3.6 V

0.05

Reference input impedance

Ω

POWER EFFICIENCY

IOUT/IDD

ILOAD = 2 mA, VDD = 5 V

93%

(1)

Linearity tested using a reduced code range of 48 to 4048; output unloaded.

(2)

Specified by design and characterization, not production tested.

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