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PLDC20G10-25PC/PI датащи(PDF) 5 Page - Cypress Semiconductor

номер детали PLDC20G10-25PC/PI
подробное описание детали  CMOS Generic 24-Pin Reprogrammable Logic Device
PDF  14 Pages
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производитель  CYPRESS [Cypress Semiconductor]
домашняя страница  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

PLDC20G10-25PC/PI датащи(HTML) 5 Page - Cypress Semiconductor

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USE ULTRA37000™ FOR
ALL NEW DESIGNS
PLDC20G10B
PLDC20G10
Document #: 38-03010 Rev. *A
Page 5 of 14
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65
°C to +150°C
Ambient Temperature with
Power Applied............................................. –55
°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage ............................................ –3.0V to +7.0V
Output Current into Outputs (LOW) .............................16 mA
DC Programming Voltage
PLDC20G10B and CG7C323B–A ............................... 13.0V
PLDC20G10 and CG7C323–A.................................... 14.0V
Latch-Up Current ..................................................... >200 mA
Static Discharge Voltage.............................................. >500V
(per MIL-STD-883, Method 8015)
Operating Range
Range
Ambient Temperature
VCC
Commercial
0
°C to +75°C
5V
±10%
Military[3]
–55
°C to +125°C
5V
±10%
Industrial
–40
°C to +85°C5V ±10%
Electrical Characteristics Over the Operating Range (Unless Otherwise Noted)[4]
Parameter
Description
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC = Min.,
VIN = VIH or VIL
IOH = –3.2 mA
Com’l/Ind
2.4
V
IOH = –2 mA
Military
VOL
Output LOW Voltage
VCC = Min.,
VIN = VIH or VIL
IOL = 24 mA
Com’l/Ind
0.5
V
IOL = 12 mA
Military
VIH
Input HIGH Level
Guaranteed Input Logical HIGH Voltage for All Inputs[5]
2.0
V
VIL
Input LOW Level
Guaranteed Input Logical LOW Voltage for All Inputs[5]
0.8
V
IIX
Input Leakage Current
VSS ≤ VIN ≤ VCC
–10
+10
µA
ISC
Output Short Circuit Current VCC = Max., VOUT = 0.5V
[6, 7]
–90
mA
ICC
Power Supply Current
0
≤ V
IN ≤ VCC
VCC = Max.,
IOUT = 0 mA
Unprogrammed Device
Com’l/Ind–15, –20
70
mA
Com’l/Ind–25, –35
55
mA
Military–20, –25
100
mA
Military–30, –40
80
mA
IOZ
Output Leakage Current
VCC = Max., VSS ≤ VOUT ≤ VCC
–100
100
µA
Capacitance[7]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz
10
pF
COUT
Output Capacitance
VIN = 2.0V, VCC = 5.0V
10
pF
Notes:
3. TA is the “instant on” case temperature.
4. See the last page of this specification for Group A subgroup testing information.
5. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid
test problems caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.



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