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SCAN921025H датащи (PDF) - Texas Instruments

SCAN921025H Datasheet PDF - Texas Instruments
номер детали SCAN921025H
скачать  SCAN921025H скачать
объем файла   1103.83 Kbytes
Page   32 Pages
производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
Logo TI2 - Texas Instruments
подробное описание детали SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

SCAN921025H Datasheet (PDF)

Go To PDF Page скачать датащи
SCAN921025H Datasheet PDF - Texas Instruments

номер детали SCAN921025H
скачать  SCAN921025H Click to download

объем файла   1103.83 Kbytes
Page   32 Pages
производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
Logo TI2 - Texas Instruments
подробное описание детали SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

SCAN921025H датащи (HTML) - Texas Instruments


SCAN921025H Информация о продукте

1FEATURES
2• High Temperature Operation to 125°C
• IEEE 1149.1 (JTAG) Compliant and At-Speed
BIST Test Mode
• Clock Recovery from PLL Lock to Random
Data Patterns
• Ensured Transition Every Data Transfer Cycle
• Chipset (Tx + Rx) Power Consumption < 600
mW (Typ) @ 80 MHz
• Single Differential Pair Eliminates Multi-
Channel Skew
• 800 Mbps Serial Bus LVDS Data Rate (at 80
MHz Clock)
• 10-bit Parallel Interface for 1 Byte Data Plus 2
Control Bits
• Synchronization Mode and LOCK Indicator
• Programmable Edge Trigger on Clock
• High Impedance on Receiver Inputs When
Power is Off data•
Bus LVDS Serial Output Rated for 27Ω Load
• Small 49-Lead NFBGA Package

APPLICATIONS random•
Automotive
• Industrial
• Military/Aerospace

DESCRIPTION
The SCAN921025H transforms a 10-bit wide parallel
LVCMOS/LVTTL data bus into a single high speed
Bus LVDS serial data stream with embedded clock.
The SCAN921226H receives the Bus LVDS serial
data stream and transforms it back into a 10-bit wide
parallel data bus and recovers parallel clock.
Both devices are compliant with IEEE 1149.1
Standard for Boundary Scan Test. IEEE 1149.1
features provide the design or test engineer access
via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to
verify differential signal integrity. The pair of devices
also features an at-speed BIST mode which allows
the interconnects between the Serializer and
Deserializer to be verified at-speed.
The SCAN921025H transmits data over backplanes
or cable. The single differential pair data path makes
PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously
reduce cost. Since one output transmits clock and
data bits serially, it eliminates clock-to-data and data•
to-data skew. The powerdown pin saves power by
reducing supply current when not using either device. Upon power up of the Serializer, you can choose to
activate synchronization mode or allow the
Deserializer to use the synchronization-to-random•
data feature. By using the synchronization mode, the
Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock
ensures a transition on the bus every 12-bit cycle.
This eliminates transmission errors due to charged
cable conditions. Furthermore, you may put the
SCAN921025H output pins into tri-state to achieve a
high impedance state. The PLL can lock to
frequencies between 20 MHz and 80 MHz.




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