FEATURES
► Complete 16-bit data acquisition system
► Simultaneous sampling of 4 internally buffered channels
► 250kSPS per channel throughput
► Differential, wide common-mode range inputs
► ±75pA typical input leakage at 25°C
► Full-scale input step settling time < 300ns
► Integrated reference and reference buffer (4.096V)
► Integrated supply decoupling capacitors
► 36mW per channel at 250kSPS, scales with throughput
► Minimal external signal conditioning
► Seamless high dynamic range
► Per sample, per channel automatic gain ranging
► Maintains ppm-level INL
► Per channel SoftSpan input ranges, bipolar or unipolar
► ±40V, ±25V, ±20V, ±12.5V, ±10V, ±6.25V, ±5V, ±2.5V
► 0V to 40V, 25V, 20V, 12.5V, 10V, 6.25V, 5V, 2.5V
► Rail-to-rail input overdrive tolerance
► High performance
► INL: ±160μV typical (±40V range)
► SNR: 94.6dB single-conversion typical (±40V range)
► DR: 98.1dB single-conversion typical (±40V range)
► THD: −117dB typical (±40V range)
► CMRR: 120dB typical
► Digital flexibility
► SPI CMOS (0.9V to 5.25V) and LVDS serial input and output
► Optional oversampling with 16-bit digital averaging
► Optional offset, gain, and phase correction
► 7.00mm × 7.00mm, 64-ball BGA full solution footprint
APPLICATIONS
► Automatic test equipment
► Avionics and aerospace
► Instrumentation and control systems
► Semiconductor manufacturing
► Test and measurement