1 Features
• Low loss integrated shunt resistor
– Internal resistance: 800 μΩ, TA = 25°C
– Continuous current: ±35 A, TA = 25°C
– Peak measurement capability: ±39.32 A
• Wide common-mode range: –0.1 V to +85 V
• High-resolution, 16-bit delta-sigma ADC
• Current monitoring accuracy: A/B Grade,
maximum
– Offset current: ±6.25 mA / ±62.5 mA
– Offset drift: ±25 μA/°C (A and B Grades)
– System gain error: ±0.75% / ±1.25%
– System gain error drift: ±25 PPM/°C, typical
– Common-mode rejection: ±0.125 / ±1.25 mA/V
• Power monitoring accuracy: A/B Grade, maximum
– ±0.85% / ±1.55% at 25°C, full scale
• Energy and charge accuracy: A/B Grade,
maximum
– ±1.35% / ±2.05% at 25°C, full scale
• Input bias current: 2.5 nA (maximum)
• Temperature sensor: ±1.5°C (maximum at 25°C)
• Programmable conversion time and averaging
• 2.94-MHz high-speed I2C interface with 16 pinselectable
addresses
• Operates from a 2.7-V to 5.5-V supply:
– Operational current: 640 μA (typical)
– Shutdown current: 5 μA (maximum)

2 Applications
• Power delivery
• Grid infrastructure
• Industrial battery packs
• Test equipment
• Telecom equipment
• Enterprise servers

3 Description
The INA740x is a digital power monitor with an
integrated current sensing element along with a 16-
bit delta-sigma ADC specifically designed for currentsensing
applications. The device can measure fullscale
currents up to ±39.32 A with common-mode
voltage support from –0.1 V to +85 V.
The INA740x reports current, bus voltage, die
temperature, power, energy and charge accumulation
while employing a precision ±0.5% integrated
oscillator, all while performing the needed calculations
in the background. The integrated temperature sensor
is ±2.5°C accurate over the junction temperature
range.
The low offset and gain drift design of the INA740x
allows the device to be used in precise systems that
do not undergo multi-temperature calibration during
manufacturing.
The device allows for selectable ADC conversion
times from 50 μs to 4.12 ms as well as sample
averaging from 1x to 1024x, which further helps
reduce the noise of the measured data.