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HX6228ABHT датащи (PDF) - Honeywell Solid State Electronics Center

HX6228ABHT Datasheet PDF - Honeywell Solid State Electronics Center
номер детали HX6228ABHT
скачать  HX6228ABHT скачать
объем файла   153.48 Kbytes
Page   12 Pages
производитель  HONEYWELL [Honeywell Solid State Electronics Center]
домашняя страница  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
подробное описание детали 128K x 8 STATIC RAM-SOI HX6228

HX6228ABHT Datasheet (PDF)

Go To PDF Page скачать датащи
HX6228ABHT Datasheet PDF - Honeywell Solid State Electronics Center

номер детали HX6228ABHT
скачать  HX6228ABHT Click to download

объем файла   153.48 Kbytes
Page   12 Pages
производитель  HONEYWELL [Honeywell Solid State Electronics Center]
домашняя страница  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
подробное описание детали 128K x 8 STATIC RAM-SOI HX6228

HX6228ABHT датащи (HTML) - Honeywell Solid State Electronics Center


HX6228ABHT Информация о продукте

GENERAL DESCRIPTION
The 128K x 8 Radiation Hardened Static RAM is a high performance 131,072 word x 8-bit static random access memory with industry-standard functionality. It is fabricated with Honeywell’s radiation hardened technology, and is designed for use in systems operating in radiation environ ments. The RAM operates over the full military temperature range and requires only a single 5 V ± 10% power supply. The RAM is wire bond programmable for either TTL or CMOS compatible I/O. Power consumption is typically less than 25 mW/MHz in operation, and less than 5 mW in the low power disabled mode. The RAM read operation is fully asynchronous, with an associated typical access time of 15 ns at 5V.

FEATURES
RADIATION
• Fabricated with RICMOS™ IV Silicon on Insulator (SOI)
   0.7 µm Process (Leff = 0.55 µm)
• Total Dose Hardness through 1x106 rad(SiO2)
• Neutron Hardness through 1x1014 cm-2
• Dynamic and Static Transient Upset Hardness
   through 1x1011 rad (Si)/s
• Dose Rate Survivability through <1x1012 rad(Si)/s
• Soft Error Rate of <1x10-10 upsets/bit-day in
   Geosynchronous Orbit
• No Latchup

OTHER
• Read/Write Cycle Times
   ≤ 16 ns (Typical)
   ≤ 25 ns (-55 to 125°C)
• Typical Operating Power <25 mW/MHz
• Asynchronous Operation
• CMOS or TTL Compatible I/O
• Single 5 V ± 10% Power Supply
• Packaging Options
   - 32-Lead Flat Pack (0.820 in. x 0.600 in.)
   - 40-Lead Flat Pack (0.775 in. x 0.710 in.)




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О Honeywell Solid State Electronics Center


Honeywell Solid State Electronics Center (SSEC) was a research and development facility of Honeywell Inc. that operated from 1957 to 1993 in Minneapolis, Minnesota, United States. The center was dedicated to the research, development, and production of solid-state electronics, including microelectronics, semiconductors, and related technologies.

During its operation, SSEC made significant contributions to the advancement of the semiconductor industry, particularly in the areas of integrated circuits, transistor design, and fabrication processes. Notable accomplishments of SSEC include the development of the first silicon transistor, the first commercial silicon planar transistor, and the first integrated circuit to use metal oxide semiconductor (MOS) technology.

In 1993, Honeywell closed the SSEC facility as part of a broader restructuring of its operations. The company's semiconductor business was subsequently sold to SGS-Thomson (now STMicroelectronics) in 1999.

*Эта информация предназначена только для общих информационных целей, мы не несем ответственности за любые убытки или ущерб, вызванные вышеуказанной информацией.




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