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STM32L443CC датащи(PDF) 153 Page - STMicroelectronics

номер детали STM32L443CC
подробное описание детали  Batch acquisition mode
PDF  207 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
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STM32L443CC датащи(HTML) 153 Page - STMicroelectronics

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STM32L443CC STM32L443RC STM32L443VC
Electrical characteristics
177
tSAMP
Sampling time in sample
and hold mode (code
transition between the
lowest input code and the
highest input code when
DACOUT reaches final
value ±1LSB)
DAC_OUT
pin connected
DAC output buffer
ON, CSH = 100 nF
-0.7
3.5
ms
DAC output buffer
OFF, CSH = 100 nF
-10.5
18
DAC_OUT
pin not
connected
(internal
connection
only)
DAC output buffer
OFF
-2
3.5
µs
Ileak
Output leakage current
Sample and hold mode,
DAC_OUT pin connected
--
-(3)
nA
CIint
Internal sample and hold
capacitor
-
5.2
7
8.8
pF
tTRIM
Middle code offset trim
time
DAC output buffer ON
50
-
-
µs
Voffset
Middle code offset for 1
trim code step
VREF+ = 3.6 V
-
1500
-
µV
VREF+ = 1.8 V
-
750
-
IDDA(DAC)
DAC consumption from
VDDA
DAC output
buffer ON
No load, middle
code (0x800)
-
315
500
µA
No load, worst code
(0xF1C)
-
450
670
DAC output
buffer OFF
No load, middle
code (0x800)
--
0.2
Sample and hold mode, CSH =
100 nF
-
315 ₓ
Ton/(Ton
+Toff)
(4)
670 ₓ
Ton/(Ton
+Toff)
(4)
IDDV(DAC)
DAC consumption from
VREF+
DAC output
buffer ON
No load, middle
code (0x800)
-
185
240
µA
No load, worst code
(0xF1C)
-
340
400
DAC output
buffer OFF
No load, middle
code (0x800)
-
155
205
Sample and hold mode, buffer ON,
CSH = 100 nF, worst case
-
185 ₓ
Ton/(Ton
+Toff)
(4)
400 ₓ
Ton/(Ton
+Toff)
(4)
Sample and hold mode, buffer OFF,
CSH = 100 nF, worst case
-
155 ₓ
Ton/(Ton
+Toff)
(4)
205 ₓ
Ton/(Ton
+Toff)
(4)
1. Guaranteed by design.
2. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).
Table 69. DAC characteristics(1) (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit



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