| поискавой системы для электроныых деталей |
|
STM32L443CC датащи(PDF) 130 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM32L443CC датащи(HTML) 130 Page - STMicroelectronics |
|
130 / 207 page ![]() Electrical characteristics STM32L443CC STM32L443RC STM32L443VC 130/207 DocID028739 Rev 2 Static latch-up Two complementary static tests are required on six parts to assess the latch-up performance: • A supply overvoltage is applied to each power supply pin. • A current injection is applied to each input, output and configurable I/O pin. These tests are compliant with EIA/JESD 78A IC latch-up standard. 6.3.13 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDDIOx (for standard, 3.3 V-capable I/O pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error above a certain limit (higher than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of the -5 µA/+0 µA range) or other functional failure (for example reset occurrence or oscillator frequency deviation). The characterization results are given in Table 57. Negative induced leakage current is caused by negative injection and positive induced leakage current is caused by positive injection. Table 56. Electrical sensitivities Symbol Parameter Conditions Class LU Static latch-up class TA = +105 °C conforming to JESD78A II Table 57. I/O current injection susceptibility(1) 1. Guaranteed by characterization results. Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on all pins except PA4, PA5, PE8, PE9, PE10, PE11, PE12 -5 NA mA Injected current on PE8, PE9, PE10, PE11, PE12 -0 NA Injected current on PA4, PA5 pins -5 0 |
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |