ST7MC1K2-Auto datasheet(340/371 Pages) STMICROELECTRONICS

340 / 371 page

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ST7MC1K2-Auto, ST7MC1K6-Auto, ST7MC2S4-Auto, ST7MC2S6-Auto

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12.12.2

Input stage (comparator + sampling)

Table 217.

Input stage (comparator + sampling)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIN

Comparator input

voltage range

VSSA -0.1

VDD +0.1

Voffset

Comparator offset error

40(1)

Ioffset

Input offset current

1µA

tpropag

Comparator

propagation delay

100

tstartup

Start-up filter duration(2)

Time waited before sampling when

comparator is turned ON, that is,

CKE = 1 or DAC = 1

(with fPERIPH = 4 MHz)

3µs

tsampling Digital sampling delay

(3)

Time needed to generate a capture in

tachogenerator mode as soon as the

MCI input toggles

4/fmtc

Time needed to capture MTIM in

MZREG (BEMF) when sampling

during PWM signal OFF time as soon

as MCO becomes ON

3 /fmtc (see Figure 151)

Time needed to set/reset the HST bit

when sampling during PWM signal

OFF time as soon as MCO becomes

ON (BEMF)

1/fmtc (see Figure 151)

Time needed to generate Z event

(MTIM captured in MZREG) as soon

as the comparator toggles (when

sampling at fSCF)

1/fSCF + 3/fmtc (see Figure 152)

Time needed to generate D event

(MTIM captured in MDREG) as soon

as the comparator toggles

1/fSCF + 3/fmtc (see Figure 152)

Time needed to set/reset the HST bit

when sampling during PWM signal

ON time after a delay (DS > 0) as

soon as MCO becomes ON

Delay programmed in DS bits

(MCONF) + 1/fmtc

(see Figure 153)

Time needed to generate Z event

(MTIM in MZREG) when sampling

during PWM signal ON time after a

delay (DS > 0) as soon as MCO

becomes ON

Delay programmed in DS bits

(MCONF) + 3/fmtc

(see Figure 153)

Time needed to generate Z event

(MTIM captured in MZREG) when

sampling during PWM signal ON time

at fSCF after a delay (DS > 0)

Delay programmed in DS bits

MCONF) + 1/fSCF + 3/fmtc

(see Figure 153)

The comparator accuracy is dependent of the environment. The offset value is given for a comparison done with all digital

I/Os stable. Negative injection current on the I/Os close to the inputs may reduce the accuracy. In particular care must be

taken to avoid switching on I/Os close to the inputs when the comparator is in use. This phenomenon is even more critical

when a big external serial resistor is added on the inputs.

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