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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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EM357-RTR датащи(PDF) 236 Page - Silicon Laboratories |
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EM357-RTR датащи(HTML) 236 Page - Silicon Laboratories |
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236 / 241 page  236 Rev 1.3 FIB Fixed Information Block FIFO First-in, First-out FPB Flash Patch and Breakpoint GPIO General Purpose I/O (pins) HF High Frequency I2C Inter-Integrated Circuit IDE Integrated Development Environment IF Intermediate Frequency IEEE Institute of Electrical and Electronics Engineers INL Integral Non-linearity ITM Instrumentation Trace Macrocell JTAG Joint Test Action Group LF Low Frequency LNA Low Noise Amplifier LQI Link Quality Indicator LSB Least significant bit MAC Medium Access Control MFB Main Flash Block MISO Master in, slave out MOS Metal Oxide Semiconductor (P-channel or N-channel) MOSI Master out, slave in MPU Memory Protection Unit MSB Most significant bit MSL Moisture Sensitivity Level NACK Negative Acknowledge NIST National Institute of Standards and Technology NMI Non-Maskable Interrupt NVIC Nested Vectored Interrupt Controller OPM One-Pulse Mode Acronym/Abbreviation Meaning |
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