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PC87309VLJ датащи(PDF) 171 Page - National Semiconductor (TI) |
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PC87309VLJ датащи(HTML) 171 Page - National Semiconductor (TI) |
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171 / 192 page ![]() Device Specifications 171 www.national.com 10.3 AC ELECTRICAL CHARACTERISTICS 10.3.1 AC Test Conditions FIGURE 10-1. AC Test Conditions, TA = 0 °C to 70 °C, VDD = 5.0 V ±10% Notes: 1. CL = 100 pF, includes jig and scope capacitance. 2. S1 = Open for push-pull output pins. S1 = VDD for high impedance to active low and active low to high impedance measurements. S1 = GND for high impedance to active high and active high to high impedance measurements. RL = 1.0KΩ for µP interface pins. 3. For the FDC open-drive interface pins, S1 = VDD and RL = 150Ω. 10.3.2 Clock Timing 1. Not tested. Guaranteed by design. Device Under Test 0.1 µf Input Output RL CL S1 Load Circuit (Notes 1, 2, 3) AC Testing Input, Output Waveform VDD 2.4 0.4 2.0 0.8 Test Points 2.0 0.8 Symbol Parameter Min Max Unit tCH Clock High Pulse Width1 8.4 nsec tCL Clock Low Pulse Width1 8.4 nsec tCP Clock Period1 20.6 21 nsec CLKIN tCL tCP tCH |
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