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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32F303XD датащи(PDF) 155 Page - STMicroelectronics |
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STM32F303XD датащи(HTML) 155 Page - STMicroelectronics |
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155 / 173 page  DocID026415 Rev 5 155/173 STM32F303xD STM32F303xE Package information 171 Device marking for LQFP144 The following figure gives an example of topside marking orientation versus pin 1 identifier location. Other optional marking or inset/upset marks, which identify the parts throughout supply chain operations, are not indicated below. Figure 56. LQFP144 marking example (package top view) 1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and therefore not yet ready to be used in production and any consequences deriving from such usage will not be at ST charge. In no event, ST will be liable for any customer usage of these engineering samples in production. ST Quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity. |
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