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STM32F479AI датащи(PDF) 111 Page - STMicroelectronics |
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STM32F479AI датащи(HTML) 111 Page - STMicroelectronics |
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111 / 208 page ![]() DocID028010 Rev 2 111/208 STM32F479xx Electrical characteristics 187 summarized in Table 17. Low-speed external user clock generated from an external source In bypass mode the LSE oscillator is switched off and the input pin is a standard I/O. The external clock signal has to respect the Table 58. However, the recommended clock input waveform is shown in Figure 28. The characteristics given in Table 36 result from tests performed using an low-speed external clock source, and under ambient temperature and supply voltage conditions summarized in Table 17. Table 35. High-speed external user clock characteristics Symbol Parameter Conditions Min Typ Max Unit fHSE_ext External user clock source frequency(1) - 1- 50 MHz VHSEH OSC_IN input pin high level voltage 0.7VDD -VDD V VHSEL OSC_IN input pin low level voltage VSS -0.3VDD tw(HSE) tw(HSE) OSC_IN high or low time(1) 1. Guaranteed by design. 5- - ns tr(HSE) tf(HSE) OSC_IN rise or fall time(1) -- 10 Cin(HSE) OSC_IN input capacitance(1) -- 5 - pF DuCy(HSE) Duty cycle - 45 - 55 % IL OSC_IN Input leakage current VSS ≤VIN ≤VDD -- ±1 µA Table 36. Low-speed external user clock characteristics Symbol Parameter Conditions Min Typ Max Unit fLSE_ext User External clock source frequency(1) - - 32.768 1000 kHz VLSEH OSC32_IN input pin high level voltage 0.7VDD -VDD V VLSEL OSC32_IN input pin low level voltage VSS -0.3VDD tw(LSE) tf(LSE) OSC32_IN high or low time(1) 450 - - ns tr(LSE) tf(LSE) OSC32_IN rise or fall time(1) -- 50 Cin(LSE) OSC32_IN input capacitance(1) -- 5 - pF DuCy(LSE) Duty cycle - 30 - 70 % IL OSC32_IN Input leakage current VSS ≤VIN ≤VDD -- ±1 µA 1. Guaranteed by design. |
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