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CF745 датащи(PDF) 171 Page - Microchip Technology |
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CF745 датащи(HTML) 171 Page - Microchip Technology |
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171 / 217 page ![]() © 1998 Microchip Technology Inc. Preliminary DS30453B-page 171 PIC16C54B/C54C/CR54B/CR54C/C55A/C56A/CR56A/C57C/CR57C/C58B/CR58B 19.0 ELECTRICAL CHARACTERISTICS - PIC16C54B/C54C/CR54B/CR54C/C55A/C56A/CR56A/C57C/CR57C/C58B/CR 58B Absolute Maximum Ratings† Ambient temperature under bias............................................................................................................ –55 °C to +125°C Storage temperature ............................................................................................................................. –65 °C to +150°C Voltage on VDD with respect to VSS ..................................................................................................................0 to +7.5V Voltage on MCLR with respect to VSS................................................................................................................0 to +14V Voltage on all other pins with respect to VSS ................................................................................. –0.6V to (VDD + 0.6V) Total power dissipation(1) .....................................................................................................................................800 mW Max. current out of VSS pin....................................................................................................................................150 mA Max. current into VDD pin ......................................................................................................................................100 mA Max. current into an input pin (T0CKI only) ......................................................................................................................±500 µA Input clamp current, IIK (VI < 0 or VI > VDD) ....................................................................................................................±20 mA Output clamp current, IOK (VO < 0 or VO > VDD) ..............................................................................................................±20 mA Max. output current sunk by any I/O pin..................................................................................................................25 mA Max. output current sourced by any I/O pin ............................................................................................................20 mA Max. output current sourced by a single I/O Port A ................................................................................................50 mA Max. output current sourced by a single I/O Port B ................................................................................................50 mA Max. output current sunk by a single I/OPort A.......................................................................................................50 mA Max. output current sunk by a single I/O Port B .....................................................................................................50 mA Note 1: Power dissipation is calculated as follows: Pdis = VDD x {IDD - ∑ IOH} + ∑ {(VDD-VOH) x IOH} + ∑(VOL x IOL) † NOTICE: Stresses above those listed under "Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. |
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