X88C64

9

A.C. CONDITIONS OF TEST

Input Pulse Levels

0V to 3V

Input Rise and

Fall Times

10ns

Input and Output

Timing Levels

1.5V

3867 PGM T08.1

Note:

(5) This parameter is periodically sampled and not 100% tested.

EQUIVALENT A.C. TEST CIRCUIT

PSEN Controlled Read Timing Diagram

3867 FHD F05

ALE

A/D0–A/D7

A8–A12

PSEN

AIN

tPLDV

DOUT

tPH

tPH

tLHLL

tAVLL

tLLAX

tPS

PWPL

ADDRESS

CE

tPLDX

tPHDZ

tPHDX

tELLL

PSEN Controlled Read Cycle

Symbol

Parameter

Min.

Max.

Units

ALE Pulse Width

80

ns

Address Setup Time

20

ns

Address Hold Time

30

ns

PSEN Read Access Time

120

ns

Data Hold Time

0

ns

Chip Enable Setup Time

7

ns

PSEN Pulse Width

150

ns

PSEN Setup Time

30

ns

PSEN Hold Time

20

ns

PSEN Disable to Output in High Z

50

ns

PSEN to Output in Low Z

10

ns

3867 PGM T09

A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)

3867 FHD F04.3

5V

1.92K

Ω

100pF

OUTPUT

1.37K

Ω